| Nature Materials Review on Protein Printing |
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Penning a protein pattern
Nanoscale spots of proteins on a chip will allow high-throughput screening of protein expression and function. They can be written with a 'multi-colour' nanofountain pen.
14 August 2003
Philip Ball
Optometronic 2000™ Integrated Optical Test & Measurements
Nanometrically aligned active feedback with super-resolution imaging
- Multiple Waveguides: 100 or more
- Multi-channel Waveguides
- Photonic Circuits
- Optical Amplifiers
- Active Components
- Free Space Interconnect
- No Pigtailing for Light Injection or Collection
- Rapid Active Feedback Optimization
- Stable to 0.02 dB
- Repeatable to 0.02 dB
- Reconfigurable to 0.02 dB
- Nanometric Alignment
- Approach to contact <1 second
- Reconfigurable in seconds
- Independent nanometric positioning of device under test (DUT) and probe fiber with on-line pre-alignment imaging
- Simultaneous Multi-parameter Super-Resolution Profiling
- Far-field/Near-field/Evanescent Fields
- Light Leakage
- Topography
- Thermal
- Electrical
- Sensitivity of -70 dBm
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System Specifications
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On-line Optics
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Type
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Far-field, Near-field and Confocal Optics
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Accessibility
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Free optical access along all axes for far-field observation, including from the direction of the probe fiber and the DUT and all perpendicular directions to the probe fiber/DUT axis.
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Detectors
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InGaAs detector for Telecom Wavelengths, Avalanche Photodiode (APD), Photomultiplier Tube (PMT)
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Video System
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On Line Video with Sensitivity to 2 µ, CCD
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Operating Modes
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Far-field Confocal & CCD Profiling
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Transmission, Reflection, Collection
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Near-fieldOptical Profiling
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Transmission, Reflection, Collection
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Refractive-Index Profiling
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Transmission and Reflection
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Topographic Profiling
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Contact or Non-contact
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Thermal and Resistance Profiling
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Contact
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Active Feedback Mechanism
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Atomic Force Sensing
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Optical, Topographic, Thermal, and ResistanceProfiling Resolution
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Optical
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from 50 nm
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Refractive Index Profiling
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from 50 nm, depending on sample
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Refractive Index Resolution
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Approximately 10-5, depending on sample
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Topographic
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from 100 nm
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Thermal
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from 100 nm
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Resistance
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from 100 nm
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Sample Positioning
Rough
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Scanner
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Inertial piezo motion with piezoelectric Flat Scanner (thickness 7 mm)
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Range
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6 mm
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Accuracy
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1 µm
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Nanometric Scanning and Positioning
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Scanner
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Piezoelectric Flat Scanner (thickness 7 mm)
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Nanometric Scan Range
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70 - 140 µm (z), 70 - 140 µm (x-y)
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Spatial resolution
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<1 nm (z), <5 nm (x-y)
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Thermal & Resistance Imaging and Measurements
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Temperature
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300°C or greater, depending on sample to be investigated
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Thermal Sensitivity
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0.01°C
Measured Resistance Change per degree: 0.38 �/°C
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Resistance Sensitivity
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0.001 �
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Electronics and Software
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Control System
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Nanonics/Topaz Controller.
Low noise control system for rough, fine scanning, and active feedback with nanometric resolution.
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Software
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Quartz software for Nanonics/Topaz controller (Win 95/98 and NT).
Active feedback control software.
Real time image display, image acquisition (up to 8 channels) and analysis, 3D rendering, & ability to provide collages of multiple images.
Refractive index profiling deconvolution software integration of confocal channel with near-field/atomic force constraints
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Profiling Introduction
The Nanonics Imaging Optometronic 2000™ is a flexible, modular, passive-component test and measurement platform which allows for nanometric alignment with active feedback. It is applicable to both passive and active component characterization. The device under test (DUT) can be rapidly positioned and repositioned with nanometric precision on one of a multiple of channels of the DUT in a completely reconfigurable, stable (0.02 dB), and repeatable fashion during the test and measurement operation. The Optometronic 2000™ provides modular solutions to critical problems in test and measurements. This application note describes the refractive index profiling module.
In the world of passive component photonic devices, waveguides stand in the center of a whole variety of components, from optical fibers to optical switches to arrayed waveguide optical multiplexers and demultiplexers. A crucial measurement of the properties of these waveguides is the distribution of the refractive index in the waveguide region. Errors in this refractive index cause errors in the guiding of light and in the distribution of the optical light field.
As part of the Optometronic 2000™ system, Nanonics Imaging has introduced a module that provides a high-resolution solution to the problem of refractive index profiling (RIP). It combines the technology of aperture-based near-field scanning optical microscopy (NSOM) with lens-based optical differential interference contrast (DIC). This combination yields important advantages that permit high spatial and refractive-index resolution of exposed and embedded waveguides.
The Optometronic 2000™ system can also provide modules for combining, with the RIP measurements, near-field and far-field super-resolution beam profiling of the most complicated waveguide structures. Presently, in collaboration with Agilent Technologies Inc., the Optometronic 2000™ can provide previously unobtainable active feedback and reconfigurable test and measurements on multiple waveguides, arrayed waveguides and other photonic circuits. Thus, the Optometronic 2000™ platform provides modules with a variety of light wave characterization solutions integrated with its singular RIP capabilities.
Optical Information with Reduced Effects of Diffraction
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To reduce the effects of diffraction, near-field scanning optical microscopy (NSOM) is employed. This technique allows for the collection of optical data with additional information that is, in general, not available in RIP measurements.
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 Figure 1. Near-field scanning optical microscopy (NSOM) plays a bridging role between conventional optical microscopy and atomic force microscopy (AFM). The additional on-line information added by NSOM to confocal DIC allows Nanonics to provide proprietary, super-resolution refractive index profiling measurements.
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Phone: +972-2-6789573 |
Fax: +972-2-6480827 |
USA Toll Free (direct to sales): 1-800-289-7162 |
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