Nanonics Imaging, Ltd. is pleased to welcome NANOSENSORS™  Akiyama-Probe (A-Probe) to its family of tuning-fork based probes.

Akiyama-Probe is based on a quartz tuning fork combined with a micromachined cantilever. The great advantage of this novel probe is that one can benefit from both the tuning fork’s extremely stable oscillation and the silicon cantilever’s reasonable spring constant with one probe.

Akiyama-Probe is equipped with a special version of the NANOSENSORS™ AdvancedTEC, a high-end sharp silicon tip and has an excellent imaging capability on various samples with different properties, which is as high as that of a conventional optical lever system.

The Akiyama-Probe incorporates all of the advantages that tuning-fork based feedback probes have and as such fits beautifully in the Nanonics tuning-fork based probe NanoTool Kit. 

For more information about the A-Probe, please visit the NANOSENSORS™  website.