| Nanonics STM Module |
The Nanonics STM is designed for excellent atomic resolution and ease of use
Scanning Tunneling Microscopy (STM) measures the topography of surface electronic states using a tunneling current that is dependent on the separation between the probe tip and a sample surface. Typically performed on conductive and semiconductive surfaces. Common applications consist of atomic resolution imaging, Scanning Tunneling Spectroscopy (STS), and low current imaging of poorly conductive samples.
Scanning Tunneling Microscopy
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STM imaging with atomic resolution
I-V Spectroscopy
I-S Spectroscopy
Compatible with environmental chamber
Tunneling currents from 50pA to 100nA
1.5 micron X-Y range
0.5 micron Z range |
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Left: 1.6x1.2nm STM image of HOPG
obtained with the STM Module |
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System Specifications
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Parameter |
Specification |
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Modes of Operation |
STM Topography, current image, spectroscopy |
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Scanning/Sample |
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Scanner |
Piezoelectric tube scanner. Drift free stage design |
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Scan Range |
XY scan range: 1.5 micron
Zscan range: 0.5 micron |
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Step Size |
X-Y scanner < 0.05 nm
Zscanner < 0.01 nm |
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Sample Positioning |
Mechanical rough positioning of sample (2.5 mm) |
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Bias Voltage |
± 5V |
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Tunnel Current |
1 to 100 nA |
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Probes |
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STM Probes |
Pt/Ir (90/10), diameter 250 micron |
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Controller |
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Controller |
Nanonics Integra controller |
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Software |
Software for Nanonics Integra Controller (Win 95/98, NT and XP). Real time image display, image acquisition (up to 4 channels) and analysis, 3D rendering. |
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Options |
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Environmental Chamber |
Control the measurement environment (humidity, gas composition, vacuum). |
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Environmental Chamber |
Control the measurement environment (humidity, gas composition, vacuum) |
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Low Current Module |
Tunnel curents from 50 pA to 10 nA |
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Fiber input |
Illumination of the sample or collection of light from the sample |
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Phone: +972-2-6789573 |
Fax: +972-2-6480827 |
USA Toll Free (direct to sales): 1-800-289-7162 |
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