The Nanonics MultiView 4000TM was featured in an article which appeared on the cover of Applied Spectroscopy magazine's January 2010 issue. Nanonics congratulates Professor Robert Shaw of Oak Ridge National Laboratory (Tennessee) for his work described in the article, "Combined Apertureless Near-Field Optical Second-Harmonic Generation/Atomic Force Microscopy Imaging and Nanoscale Limit of Detection".

Below is a description of the cover:

"Chemical imaging at the nanoscale is becoming an important tool for following chemical changes at a near molecular length scale. Spatially registered physical images complement the chemical information. A full understanding of processes such as catalysis at few nanometer-diameter noble metal particles or energy and charge transport across nanoscale donor-accepted boundaries in bulk heterojunction photovoltaic devices awaits the ability to watch these processes with spatial resolution measured in nanometers. The article Combined Apertureless Near-Field Optical Second-Harmonic Generation/Atomic Force Microscopy Imaging and Nanoscale Limit of Detection describes an instrument that utilizes femtosecond laser pulses to probe zinc oxide nanowires, with the imaging contrast provided by second-harmonic generation (SHG). A metallized scanning probe tip that is rastered over the sample surface provides near-field signal enhancement and localization of the optical effect to dimensions below the diffraction limit. The photo inset of the scanning tip was provided by Nanonics Imaging Ltd."

Click to go to the abstract.