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Electrical and Thermal SPM
Graphene Transistor AFM_EFM Imaging
Thermo Conductivity Imaging of Semiconductor Chip
Scanning Thermal Microscopy of GaN NanoWires
Scanning Photocurrent in Graphene Transistors
MultiProbe AFM_Thermal_Electrical and NSOM Imaging
Kelvin Probe Imaging of Graphene
Kelvin Probe Imaging of Gold Silicon
KPM Imaging of Gold Electrode on Doped Silicon
Kelvin Probe Imaging of Au/Cr
Schottky Diode I-V Characterization
Current Mapping of Au Electrodes on Silicon
Spreading Resistance Electrical Imaging of Au_Si
Au etched groove on silicon
Thermo Resistance Imaging of Chip




Nano Optical and Thermal SPM

 

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The MultiView 4000TM System simplifies the task of optically and thermally profiling on-line an optoelectronic device. Seen in these images (above) are the optical distribution of light in a quantum wire laser (NSOM) and the thermal distribution around the laser. The image below includes the p contact region in the thermal image. As can be seen, the thermal and light distribution bear no correlation to one another, but rather the thermal distribution is bowed towards the p contact where electrical charge is injected.

 

AFM Thermo Resistive Nanonics Probe

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 In the Dual Wire Thermo-Resistance probe, two platinum wires are stretched through the nanopipette and fused together at their tips. This fused junction has a resistance that is temperature-dependent. This unique tip allows simultaneous measurement of surface topography and thermal conductivity

 



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