The MultiView 4000 system has been awarded a very prestigious award from Semiconductor International Magazine - “The 2007 Editors Choice Best Products Award”.
Competing against many other companies and products throughout the semicondutor industry, our product was chosen from one of 21 winners to represent products that provide the most potential importance to the semiconductor industry.
Click on the link below to go straight to the Semiconductor International web site where all the 21 winners are listed together with short descriptions on the products chosen.
http://www.reed-electronics.com/semiconductor/article/CA6455487
"The MultiView 4000/NanoRaman/AFM is an integrated tip-enhanced system for chemical characterization with up to four independently controlled scanned probe microscopes online for correlated functional and structural imaging with atomic force microscopy (AFM) techniques. The MultiView is a solution that can be integrated into standard optical microscopes with high numerical aperture (NA) lenses to collect the weak Raman signal. It also has cantilevered glass probes for AFM without the Raman background of standard silicon AFM cantilevers. It uses tuning forks for feedback, which do not provide any optical background that standard AFM laser-based feedback mechanisms cause."
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