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Available Modes of Operation |
| AFM |
AC Mode, Contact Mode and all standard AFM modes of operation |
| Differential Interference Contrast and Phase Imaging |
Reflection and Transmission |
| On-line Far-field Confocal with Raman and Fluorescence Spectral Imaging |
Reflection and Transmission |
| Liquid Cell Operation |
For AFM and other SPM measurements in liquids with a completely free optical axis allowing for all modes of optical imaging including phase imaging. In addition to all standard silicon cantilevers, cylindrical glass cantilevers for AFM operation are provided. Such cylindrical cantilevers are not damped by the liquid environment and permit AFM operation without Q control allowing for higher fidelity in AFM liquid imaging. |
| Thermal Conductivity and Spreading Resistance Profiling |
Contact or AC mode
No Feedback Laser Induced Extraneous Carriers in Semiconductors (using optional tuning fork feedback module)
The probes also can act as a nanoheater for heat induced point alterations upto 700oC which can be used for the induction of phase transitions or thermally induced chemistry.
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| NanoLithography |
Software and hardware for correlation of the position of the AFM sensor for writing nanolithographic patterns. This includes patterning with Nanonics exclusive nanofountain pen nanochemical lithography package. The hardware and software also permit external triggers for either electrical pulses or optical pulses or other external sources in concert with the patterning operation. |
| NanoFountain Pen NanoChemical Nanolithography |
Components for nanofountain pen nanochemical nanolithography liquid delivery for use with the Nanonics 3D lithography package and NanoChemwrite™ Software Package. The only System allowing for gas writing with a controlled environment chamber fully integrated into optical microscopy. Environmental chamber also permits controlled environments of gases or humidity for chemical or other writing tasks. Nanoheaters available for thermally induced chemical writing and near-field optical point light sources for optically induced chemical writing. |
| NanoIndentation |
Application of MegaPascals of force, allowing exact positioning and controlled application of force with on-line analysis. Scripting of the nanoindentation pattern. |
| NanoManipulation |
Placement and movement of probe for controlled placement of particles and other nanomanipulation tasks. |
| Environmental Control |
Controlled environment chamber with full integration into an optical microscope. Also permits 100x 0.7NA viewing from below.
Constant humidity capabilities: 5% - 95% with error of 0.2%
Inlets for other substances for environmental controls, including additional gas inlet for the environmental control .
Cooling to 4°C – Heating to 40°C
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| Sample cooling/heating |
Ability to heat solid state samples up to 350 degrees centigrade and cool samples to -20 degrees centigrade using evacuated environmental chamber as above. |
| Other Modes of Operation |
Refractive-Index Profiling in Reflection and Transmission |
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SPM Scan Head Specifications |
| Sample Scanner |
Piezoelectric Based Flat Scanner (3D Flat Scanner™)
Height 7mm
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| SPM Scan Range |
Up to 100 microns (X, Y and Z) sample scanning |
| Scanner Resolution |
< 0.005 nm (Z)
< 0.015 nm (XY)
< 0.002 nm (XY) low voltage mode |
| Rough Positioning |
Sample rough positioning:
6 mm rough positioning of sample via piezo electric 3D Flat Scanner |
| Feedback Mechanism |
Beam bounce Attachment (Standard)
Tuning fork (Optional)
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| Sample Geometries |
Sample size: Up to 16 mm standard
Up to 34mm for upright microscope operation
Unconventional Geometries: Hanging samples for edge profiling and other unconventional geometries possible
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| Probes |
Specialized glass probes with exposed tip geometry and all forms of silicon cantilever probes can be used. |
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Imaging Resolution |
| Far-field |
Diffraction Limited |
| Optical |
Optics providing 500 nm diffraction limited non-confocal operation |
| Confocal |
200 nm |
| Topographic |
Z noise 0.05 nm rms.
X.Y lateral resolution: convolution of tip diameter & sample |
| Thermal |
From 100 nm |
| Resistance |
From 25 nm |
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Thermal & Resistance Imaging |
| Temperature |
350 ºC or greater, depending on sample to be investigated |
| Thermal |
Unique exposed tip dual platinum nanowire probes fully insulated with glass coating:
Thermal Sensitivity 0.01 ºC
Measured Resistance Change per degree; 0.38 Ω/ºC |
| Resistance |
Unique exposed tip platinum nanowire probes fully insulated with glass coating and allowing for coax geometry structures:
Ultra high electro potential resolution
Few tens of ohms contact resistance for probes <100nm
Electrically stable & free from oxidation |
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Electronics & Software |
| Control System |
Integra Controller
Specifications
Supports various imaging modes including AFM (contact and non-contact), phase, error signal and NSOM.
Up to 8 data channels can be read and imaged simultaneously.
All ADCs are 16 bit and DACs have16-bit resolution.
Image size continuously variable from 2x2 to 1024x1024
Inbuilt lock-in amplifier
There are two alternative software packages available:
Quartz Software Package Specifications:
User friendly 32-bit Windows application available for Windows 95/98, NT and XP.
Intuitive scan parameter setup
Image and line profiles displayed in real time.
2-D and 3-D image rendering
Extensive image processing options
Comprehensive image analysis features including: cross section, particle analysis, fractal analysis and z-data histogram.
Import data as Windows bitmaps and ACSII. Export data as TIFF and Windows bitmaps and ACSII.
LabView Software Package Specifications
User friendly LabView SPM based software for PCI-7344 with the following specifications:
AUX Data acquisition
Image and line profiles displayed in real time.
Intuitive scan parameter setup
Open Design enabling Customization by User and interfacing to other LabView modules.
Nanonics Controller and software package based on Windows XP and Windows XP LabView based software package. Real time image display, image acquisition up to 8 channels. Full access to all signals and readily integrated with external signals from other sources. Analysis software including all standard image processing routines and 3D rendering including collages of multiple signals.
Software modules available for spectral acquisition and analysis including Raman and fluorescence spectra, nanoindentation, nanolithography including NanoChemwrite™ Fountain Pen NanoChemistry™ software suite.
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| Data Acquisition |
From 2x2 to 1024x1024 and multiple Z acquisition |
| Analog Lock-in |
Provides quadrature output. Information is readily available on R/Ө and I/Q in output bandwidths of 15kHz (depending on DT card in use; the controller can give up to 100 kHz).
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| Frequency Synthesizer |
Direct Digital Synthesizer (DDS) system for frequency and phase adjustment with 32-bit frequency determination and 20-bit phase determination. This system uses three independent generators. Two of these generators provide quadrature for lock-in processing and the third generator is used for exciting with an autophase algorithm. The system uses a clock frequency of 20 MHz with a stability of 5 ppm and provides frequency resolution of <5 mHz.
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| Amplitude |
0 to 5 V p-p and maximum resolution of up to 0.2 mV
Amplitude, Phase and Frequency of the oscillator can be controlled with 100 kHz updates. |
| X, Y, and Z High Voltage Outputs |
-145V to +145V |
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On-line Optical and Electron/Ion Optical Integration |
| Type |
Far-field, Confocal Optics , micro-Raman; Scanning Electron Microscope (SEM) or Focused Ion Bean (FIB)
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| Integration |
Free optical axis from above and below the sample for on-line optical or electron/ion optical characterization.
Integration with all forms of optical microscopes including upright microscopes and upright microscope probe stations.
Integration with all standard microRaman 180 degree backscattering geometry configurations, inverted microscopes and state of the art dual (4Pi) microscopes such as Nanonics unique dual microscope.
All conventional far-field optical modes of operation are available, including phase imaging and differential interference contrast.
NSOM with any optical microscope including: upright, inverted and dual.
The completely free optical axis from above and below in all Nanonics MultiView Systems also allows for integration with (4Pi) dual microscopes for non-linear optical techniques including second harmonic and sum frequency generation microscopes, third harmonic imaging, coherent anti-Stokes Raman microscopes and stimulated emission depletion microscopy.
All Nanonics Systems and all Nanonics Multiple Probe Systems are unique scanned probe microscopes with a completely free axis above the sample and thus can be integrated transparently into scanning electron microscopes including field emission SEM’s or focused ion beam systems.
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Minimum Working Distance
(WD) with High Numerical
Aperture (NA) Optical
Microscope Lenses |
Upright Microscope or SEM or FIB:
Optical Objective: 100 X with 0.75NA
Objective WD: 6.5 mm
Inverted Microscope:
All available objectives including oil immersion optical objectives
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| Video system |
On Line CCD video imaging |
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On-line Spectroscopy Options |
| iHR320 Imaging Spectrometer |
Features
- Up to 4 ports, 2 entrance, 2 exit
- Internal Filter Wheel (optional)
- Choice of 2, slits for high resolution or 7mm slits for high throughput
- Kinematic turret with easy access hatch
- Choice of CCD or Exit Slit on either exit port
- Easy CCD focus and alignment with external locking mechanism
- CCD flanges for resolution or imaging optimization
- Purge port for UV and NIR
- USB 2.0 with additional hub port
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| Specifications |
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| Focal Length |
320 mm |
| Aperture |
f/4.1 |
| Spectral Range |
150 to 1500 nm with 1200 g/mm grating
150 nm to 40 mm with appropriate gratings |
| Grating Size |
68 mm x 68 mm |
| Number of Gratings on Turret |
3 |
| Flat Field Size |
30 mm x 12 mm |
| Resolution with Exit Slit and PMT |
0.06 nm |
| Wavelength Accuracy |
±0.20 nm |
| Repeatability |
±0.075 nm |
| Spectral Dispersion |
2.35 nm/mm |
| Magnification |
1.1 |
| Stray Light |
5 x 10-4 |
| Scan Speed |
159 nm/sec |
| Step Size |
0.002 nm |
| Computer Interface |
USB 2.0 (USB 1.1 compatible) |
| Dimensions |
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| Length |
417 mm (16.4 in) |
| Width |
422 mm (16.6 in) |
| Height |
192 mm (7.6 in) |
| Optical Axis Height from the bottom of the instrument |
98 mm (3.9 in) |
| Nominal Weight |
20 kg (45 lb) |
