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| Home > Products > SPM & NSOM Systems > MultiView 1000™ > | |
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| Downloads | ||
| The Nanonics Integra Controller | ||
| MV 1000 Brochure | ||
| Read a full description of the Nanonics Dual Microscope System. | ||
Integration with Complementary Techniques The open system architecture also enables the MultiView 1000™ to be integrated with other instruments:
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The award winning MultiView 1000™ is the first system available that fully integrates all forms of scanned probe microscopy with conventional optical microscopy.
| The standard probes used in Nanonics systems are cantilevered optical fibers. They provide for normal force feedback, have unique advantages in permitting a second channel of illumination or collection, and allow transparent, integrated and simultaneous far-field, lens-based imaging. |  |
Straight NSOM fiber probes, micromachined cantilevered NSOM probes and standard, silicon AFM probes can also be used with the MultiView 1000™. In addition, Nanonics produces customized fiber probes to customer specifications, such as probes with tip lengths greater than 500 mm for deep-trench probing and probes with unique force constant and resonance frequency combinations.
Complete NSOM/AFM/Confocal Systems
Nanonics provides a complete NSOM/SPM microscopy system, including a host microscope with confocal detection, a control system, an illumination/detection system, and the widest variety of additional system accessories available on the market.
Modular & Customized Systems
Another important advantage of the MultiView 1000™ is its modularity. Because the Nanonics system readily sits on the sample stage of any conventional far-field microscope and is compatible with most commercial control systems, users can also incorporate the MultiView 1000™ into pre-existing microscopy systems. Our in-house team of experts also works with each customer on a one-to-one basis to provide customized solutions that suit the particular requirements of the research to be undertaken.
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| The MultiView 1000™ Integrated into the vacuum chamber of a SEM |
The MultiView 1000™ Integrated onto a standard Raman Microscope |
The MultiView 1000™ inside an Environmental Chamber for humidity and environmental control. |
Available options for the MultiView 1000™
- Liquid Cell - perform NSOM/AFM measurements on samples in liquid.
- Environmental Chamber - control your measurement environment.
- Nanochemical Delivery - deliver chemicals with nanometer precision to your sample surface.
- 3D Nanolithography - software for lithography applications.
- For more options and additional details see below.
Closed Loop OptionWith the inclusion of embedded closed loop sensors, the Nanonics 3D Flat Scanner can return the sample to a precise spot with an accuracy of 20 nm. This is unaffected by hysteresis, creep, non-linearity or aging of the piezoceramic. Therefore, the MultiView 1000™ with closed loop sensors can perform linearization of the scanner both on-line and off-line during a scan. With the addition of a third z-axis sensor the Nanonics 3D Flat Scanner can perform strictly horizontal movement of the scanner. This can be essential in particular in confocal imaging or when working with certain liquid samples.
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Overall, the MultiView 1000™ is a robust and versatile SPM system which allows the user to zoom, with overlapping fields of view, from the lowest resolutions of conventional far-field imaging to the higher resolutions of confocal microscopy, and finally, to the ultimate resolutions of AFM and NSOM.
System Specifications
| Available Modes of Operation | |
| AFM | AC Mode, Contact Mode and all standard AFM modes of operation |
| Near-field Optical Imaging & Illumination | Transmission, Reflection, Collection, Illumination |
| Differential Interference Contrast and Phase Imaging | Reflection and Transmission |
| On-line Far-field Confocal with Raman and Fluorescence Spectral Imaging | Reflection and Transmission |
| Liquid Cell Operation | For AFM, NSOM and other SPM measurements in liquids with a completely free optical axis allowing for all modes of optical imaging including phase imaging. In addition to all standard silicon cantilevers, cylindrical glass cantilevers for AFM and NSOM operation are provided. Such cylindrical cantilevers are not damped by the liquid environment and permit AFM operation without Q control allowing for higher fidelity in AFM and NSOM liquid imaging. |
| Thermal Conductivity and Spreading Resistance Profiling |
Contact or AC mode |
| NanoLithography | Software and hardware for correlation of the position of the AFM sensor for writing nanolithographic patterns. This includes patterning with Nanonics exclusive nanofountain pen nanochemical lithography package. The hardware and software also permit external triggers for either electrical pulses or optical pulses or other external sources in concert with the patterning operation. |
| NanoFountain Pen NanoChemical Nanolithography | Components for nanofountain pen nanochemical nanolithography liquid delivery for use with the Nanonics 3D lithography package and NanoChemwrite™ Software Package. The only System allowing for gas writing with a controlled environment chamber fully integrated into optical microscopy. Environmental chamber also permits controlled environments of gases or humidity for chemical or other writing tasks. Nanoheaters available for thermally induced chemical writing and near-field optical point light sources for optically induced chemical writing. |
| NanoIndentation | Application of MegaPascals of force, allowing exact positioning and controlled application of force with on-line analysis. Scripting of the nanoindentation pattern. |
| NanoManipulation | Placement and movement of probe for controlled placement of particles and other nanomanipulation tasks. |
| Environmental Control |
Controlled environment chamber with full integration into an optical microscope. Also permits 100x 0.7NA viewing from below. Constant humidity capabilities: 5% - 95% with error of 0.2% Inlets for other substances for environmental controls, including additional gas inlet for the environmental control . Cooling to 4°C – Heating to 40°C |
| Sample cooling/heating | Ability to heat solid state samples up to 350 degrees centigrade and cool samples to -20 degrees centigrade using evacuated environmental chamber as above. |
| Other Modes of Operation | Refractive-Index Profiling in Reflection and Transmission |
| SPM Scan Head Specifications | |
| Sample Scanner |
Piezoelectric Based Flat Scanner (3D Flat Scanner™) |
| SPM Scan Range | Up to 100 microns (X, Y and Z) sample scanning |
| Scanner Resolution | < 0.005 nm (Z) < 0.015 nm (XY) < 0.002 nm (XY) low voltage mode |
| Rough Positioning | Sample rough positioning: 6 mm rough positioning of sample via piezo electric 3D Flat Scanner |
| Feedback Mechanism |
Beam bounce Attachment (Standard) |
| Sample Geometries |
Sample size: Up to 16 mm standard |
| Probes | Specialized glass probes with exposed tip geometry and all forms of silicon cantilever probes can be used. |
| Imaging Resolution | |
| Far-field | Diffraction Limited |
| Optical | Optics providing 500 nm diffraction limited non-confocal operation |
| Confocal | 200 nm |
| NSOM | 100 nm on installation; 50 nm probes available |
| Topographic | Z noise 0.05 nm rms. X.Y lateral resolution: convolution of tip diameter & sample |
| Thermal | From 100 nm |
| Resistance | From 25 nm |
| Thermal & Resistance Imaging | |
| Temperature | 350 ºC or greater, depending on sample to be investigated |
| Thermal | Unique exposed tip dual platinum nanowire probes fully insulated with glass coating: Thermal Sensitivity 0.01 ºC Measured Resistance Change per degree; 0.38 Ω/ºC |
| Resistance | Unique exposed tip platinum nanowire probes fully insulated with glass coating and allowing for coax geometry structures: Ultra high electro potential resolution Few tens of ohms contact resistance for probes <100nm Electrically stable & free from oxidation |
| Electronics & Software | |
| Control System |
Integra Controller
Specifications There are two alternative software packages available:
Quartz Software Package Specifications:
LabView Software Package Specifications Nanonics Controller and software package based on Windows XP and Windows XP LabView based software package. Real time image display, image acquisition up to 8 channels. Full access to all signals and readily integrated with external signals from other sources. Analysis software including all standard image processing routines and 3D rendering including collages of multiple signals. Software modules available for spectral acquisition and analysis including Raman and fluorescence spectra, nanoindentation, nanolithography including NanoChemwrite™ Fountain Pen NanoChemistry™ software suite. |
| Data Acquisition | From 2x2 to 1024x1024 and multiple Z acquisition |
| Analog Lock-in |
Provides quadrature output. Information is readily available on R/Ө and I/Q in output bandwidths of 15kHz (depending on DT card in use; the controller can give up to 100 kHz). |
| Frequency Synthesizer |
Direct Digital Synthesizer (DDS) system for frequency and phase adjustment with 32-bit frequency determination and 20-bit phase determination. This system uses three independent generators. Two of these generators provide quadrature for lock-in processing and the third generator is used for exciting with an autophase algorithm. The system uses a clock frequency of 20 MHz with a stability of 5 ppm and provides frequency resolution of <5 mHz. |
| Amplitude | 0 to 5 V p-p and maximum resolution of up to 0.2 mV Amplitude, Phase and Frequency of the oscillator can be controlled with 100 kHz updates. |
| X, Y, and Z High Voltage Outputs | -145V to +145V |
| On-line Optical and Electron/Ion Optical Integration | |
| Type |
Far-field, Confocal Optics , micro-Raman; Scanning Electron Microscope (SEM) or Focused Ion Bean (FIB) |
| Integration |
Free optical axis from above and below the sample for on-line optical or electron/ion optical characterization. Integration with all forms of optical microscopes including upright microscopes and upright microscope probe stations. Integration with all standard microRaman 180 degree backscattering geometry configurations, inverted microscopes and state of the art dual (4Pi) microscopes such as Nanonics unique dual microscope. All conventional far-field optical modes of operation are available, including phase imaging and differential interference contrast. NSOM with any optical microscope including: upright, inverted and dual. The completely free optical axis from above and below in all Nanonics MultiView Systems also allows for integration with (4Pi) dual microscopes for non-linear optical techniques including second harmonic and sum frequency generation microscopes, third harmonic imaging, coherent anti-Stokes Raman microscopes and stimulated emission depletion microscopy. All Nanonics Systems and all Nanonics Multiple Probe Systems are unique scanned probe microscopes with a completely free axis above the sample and thus can be integrated transparently into scanning electron microscopes including field emission SEM’s or focused ion beam systems. |
| Minimum Working Distance (WD) with High Numerical Aperture (NA) Optical Microscope Lenses |
Upright Microscope or SEM or FIB:
Inverted Microscope: |
| Detectors | Photomultiplier Tube, Avalanche Photo Diode or InGaAs Detectors |
| Lasers | Variety of lasers can be used from deep UV to near-IR |
| Video system | On Line CCD video imaging |
| On-line Spectroscopy Options | |
| iHR320 Imaging Spectrometer |
Features
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| Specifications | |
| Focal Length | 320 mm |
| Aperture | f/4.1 |
| Spectral Range | 150 to 1500 nm with 1200 g/mm grating 150 nm to 40 mm with appropriate gratings |
| Grating Size | 68 mm x 68 mm |
| Number of Gratings on Turret | 3 |
| Flat Field Size | 30 mm x 12 mm |
| Resolution with Exit Slit and PMT | 0.06 nm |
| Wavelength Accuracy | ±0.20 nm |
| Repeatability | ±0.075 nm |
| Spectral Dispersion | 2.35 nm/mm |
| Magnification | 1.1 |
| Stray Light | 5 x 10-4 |
| Scan Speed | 159 nm/sec |
| Step Size | 0.002 nm |
| Computer Interface | USB 2.0 (USB 1.1 compatible) |
| Dimensions | |
| Length | 417 mm (16.4 in) |
| Width | 422 mm (16.6 in) |
| Height | 192 mm (7.6 in) |
| Optical Axis Height from the bottom of the instrument | 98 mm (3.9 in) |
| Nominal Weight | 20 kg (45 lb) |
| All specifications given for 1200 g/mm grating at 435 nm and are subject to change without notice. |
| Raman Spectroscopy Package for On-line Pixel by Pixel Integration of AFM & Raman | |
| inVia Raman microscope |
Standard Features
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Phone: +972-2-6789573 | Fax: +972-2-6480827 | USA Toll Free (direct to sales): 1-800-289-7162 |
| Dip Pen | Patch Clamping | Photonic Band Gap | atomic force microscopy | scanning probe microscope | near field optics | NanoLithography | |||
| Copyright @ 2007 Nanonics Ltd. All rights reserved to Nanonics- SNOM | AFM raman | | |||
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