Only the MultiView 4000TM utilizing Dual Wire Thermo-Resistance probes with their exposed probe tip is capable of these functions.A thermal conductivity image (Upper Right) of a static random access memory (SRAM) device is compared with the AFM topography (Upper Left) , Electrical (Lower Right) and NSOM Imaging (Lower Left).

Performed with Nanonics unique ultrastable Nano-wire glass insulated electrical probe

• Ultrastable solid wire electrical probes q Ultra-Sensitive Tuning Fork  Normal Force feedback
• Geometrical friendly for online multiprobe all under active AFM feedback.
• Low contact resistance and full insulation with glass upto the probe tip for high electro-potential resolution
• Glass coating insulation can be overcoated with metal to emulate coax geometries for ultrahigh sensitivity electrical imaging
• High cantilever design that minimizes cantilever electrical interference

 AFM Thermoresistive Nanonics Probe

In the Dual Wire Thermo-Resistance probe, two platinum wires are stretched through the nanopipette and fused together at their tips. This fused junction has a resistance that is temperature-dependent. This unique tip allows simultaneous measurement of surface topography and thermal conductivity