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Topographic and Phase Measurements
Sample 1: Impact- modified PMMA
Scan range: 1x1microns
Measurements were done using Nanonics AFM probe with tip diameter 10 nm and SPM MV-400 Resonance Frequency of Probe 50 KHz on a Renishaw Raman MicroSpectrometer.
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Topographic Image
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Phase Measurement
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The sensitivity of the phase image is shown by the differential imaging of different chemical constitution (see contrast of red and green arrow relative to blue arrow indicating the background. Such an effect is only seen in the phase image but not the topography image.
Line Scan of the Topographic Image
Line Scan of the Phase Image
Topographic and Phase Measurements
Measurements were done using Nanonics AFM probe with tip diameter 10 nm and SPM MV-400. Same probe was used as in the first set of measurements, but at a different place on the sample.
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Topographic Image
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Phase Measurement
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Line Scan of the Topographic Image
Line Scan of the Phase Image
Topographic and Phase Measurements
Measurements were done using Nanonics AFM probe with tip diameter 10 nm and SPM MV-2000 Resonance Frequency of Probe 36 KHz on a Renishaw Raman MicroSpectrometer.
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Topographic Image
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Phase Measurement
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Topographic and Phase Measurements
Measurements were done using Si probe with tip diameter 10 nm on an SPM MV-400 Resonance Frequency of Probe 145 KHz on a Renishaw Raman MicroSpectrometer.
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Topographic Image
|
Phase Measurement
|
Topographic and Phase Measurements
Measurements were done using Si probe with tip diameter 10 nm on an SPM MV-400
Same probe was used as in the previous set of measurements, but at a different place on the sample.
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Topographic Image
|
Phase Measurement
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