Home > Galleries > Image Gallery > Electrical and Thermal SPM > KPM Imaging of Gold Electrode on Doped Silicon > 
Print version
Electrical and Thermal SPM
Graphene Transistor AFM_EFM Imaging
Thermo Conductivity Imaging of Semiconductor Chip
Scanning Thermal Microscopy of GaN NanoWires
Scanning Photocurrent in Graphene Transistors
Nano Optical and Thermal SPM
MultiProbe AFM_Thermal_Electrical and NSOM Imaging
Kelvin Probe Imaging of Graphene
Kelvin Probe Imaging of Gold Silicon
Kelvin Probe Imaging of Au/Cr
Schottky Diode I-V Characterization
Current Mapping of Au Electrodes on Silicon
Spreading Resistance Electrical Imaging of Au_Si
Au etched groove on silicon
Thermo Resistance Imaging of Chip




KPM Imaging of Gold Electrode on Doped Silicon

 

afm_498  kpm_498 
 Height AFM image of gold electrode on doped silicon surface   KPM image shows the Contact Potential Difference of gold electrode on doped silicon  
 

Performed with Nanonics unique ultrastable Nano-wire glass insulated electrical probe.

 electrical_probe_600_04

  • Ultrastable solid wire electrical probes q Ultra-Sensitive Tuning Fork  Normal Force feedback
  • Geometrical friendly for online multiprobe all under active AFM feedback.
  • Low contact resistance and full insulation with glass upto the probe tip for high electro-potential resolution
  • Glass coating insulation can be overcoated with metal to emulate coax geometries for ultrahigh sensitivity electrical imaging
  • High cantilever design that minimizes cantilever electrical interference

 



Phone: +972-2-6789573 Fax: +972-2-6480827 USA Toll Free (direct to sales): 1-800-289-7162