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Electrical and Thermal SPM
Graphene Transistor AFM_EFM Imaging
Thermo Conductivity Imaging of Semiconductor Chip
Scanning Thermal Microscopy of GaN NanoWires
Scanning Photocurrent in Graphene Transistors
Nano Optical and Thermal SPM
MultiProbe AFM_Thermal_Electrical and NSOM Imaging
Kelvin Probe Imaging of Graphene
Kelvin Probe Imaging of Gold Silicon
KPM Imaging of Gold Electrode on Doped Silicon
Schottky Diode I-V Characterization
Current Mapping of Au Electrodes on Silicon
Spreading Resistance Electrical Imaging of Au_Si
Au etched groove on silicon
Thermo Resistance Imaging of Chip
Kelvin Probe Imaging of Au/Cr

 

afm1_519  kpm1_521_01 
afm_profile1_593 kpm_profile1_564 
AFM Height image of FIB etched gold on Chromium sample  and line profile respectively (below)    Kelvin Probe image shows contact potential difference of Au/Cr structure.  

 

afm_435  kpm_439 
 Height  KPM
   
   

afm_profile_468_01   Height Profile
 kpm_profile_468_01  CPD Profile

Performed with Nanonics unique ultrastable Nano-wire glass insulated electrical probe.

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  • Ultrastable solid wire electrical probes q Ultra-Sensitive Tuning Fork  Normal Force feedback
  • Geometrical friendly for online multiprobe all under active AFM feedback.
  • Low contact resistance and full insulation with glass upto the probe tip for high electro-potential resolution
  • Glass coating insulation can be overcoated with metal to emulate coax geometries for ultrahigh sensitivity electrical imaging
  • High cantilever design that minimizes cantilever electrical interference
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