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Nanonics STM Module

The Nanonics STM is designed for excellent atomic resolution and ease of use


Scanning Tunneling Microscopy (STM) measures the topography of surface electronic states using a tunneling current that is dependent on the separation between the probe tip and a sample surface. Typically performed on conductive and semiconductive surfaces. Common applications consist of atomic resolution imaging, Scanning Tunneling Spectroscopy (STS), and low current imaging of poorly conductive samples.



 

Scanning Tunneling Microscopy

  • STM imaging with atomic resolution
  • I-V Spectroscopy
  • I-S Spectroscopy
  • Compatible with environmental chamber
  • Tunneling currents from 50pA to 100nA
  • 1.5 micron X-Y range
  • 0.5 micron Z range 
    		•   


    Left: 1.6x1.2nm STM image of HOPG
    obtained with the STM Module


    System Specifications

    Parameter

    Specification

    Modes of Operation

    STM Topography, current image, spectroscopy

    Scanning/Sample

    Scanner

    Piezoelectric tube scanner. Drift free stage design

    Scan Range

    XY scan range: 1.5 micron
    Zscan range: 0.5 micron

    Step Size

    X-Y scanner < 0.05 nm
    Zscanner < 0.01 nm

    Sample Positioning

    Mechanical rough positioning of sample (2.5 mm)

    Bias Voltage

    ± 5V

    Tunnel Current

    1 to 100 nA

    Probes

    STM Probes

    Pt/Ir (90/10), diameter 250 micron

    Controller

    Controller

    Nanonics Integra controller

    Software

    Software for Nanonics Integra Controller (Win 95/98, NT and XP). Real time image display, image acquisition (up to 4 channels) and analysis, 3D rendering.

    Options

    Environmental Chamber

    Control the measurement environment (humidity, gas composition, vacuum).

    Environmental Chamber

    Control the measurement environment (humidity, gas composition, vacuum)

    Low Current Module

    Tunnel curents from 50 pA to 10 nA

    Fiber input

    Illumination of the sample or collection of light from the sample

     
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