• Specialized Scanning:
  - Two award-winning Nanonics' FlatScan^TM stages for Tip and Sample Scanning.
  - Up to 100 microns in X,Y & Z axis per scanner
  - Up to 200 microns in X,Y & Z axis in combined scanners
  - High step resolution and high resonance frequency
  - Unique Large Z range of 100 µm
  
  
• Feedback:
  - The accepted ultimate in feedback of tuning forks without any optical interference.
  
  
• Optical & other Online Integrations:
  - Free optical axis for transparent integration with true confocal optical microscopes of upright, inverted and dual configurations.
  - Powerful objectives of high magnification (100x) and Large NA (0.75) including water immersion objectives from top.
  - Raman microscopes, electron and ion optical microscopes, environmental glove box and high vacuum chambers,
  
  
• Samples:
  - Odd size and large samples including hanging geometries
  - Customized for various samples geometries.
  
  
• Probes:
  - All forms of cantilevered glass probes from Nanonics' exclusive NanoToolKit^TM; Nanosensors including Akiyama tuning forks probes and Si probes

The First Combined Tip-and Sample-Scanning Probe System

MultiView 2000^TM was designed for unique AFM/Raman/TERS and NSOM/ANSOM protocols. It incorporates variety of technology innovations for addressing these fields:

• A) The 3D FlatScan^TM Scanner Technology
• B) Breakthrough in Tuning Fork Feedback
• C) Tip and Sample Scanning Capabilities

A) The 3D FlatScanTM Scanner Technology

Unlike the geometric constraints of standard piezo scanners, the design of the 3D FlatScan^TM is a novel planar, folded-piezo, flexure scan design which provides the ultimate in AFM resolution (e.g. atomic steps in Highly Oriented Pyrolytic Graphite [HOPG], see middle picture below). The FlatScan^TM provides a large vertical (axial) displacement of up to 100 microns that facilitates tracking structures with very large topographical features, and simultaneous lateral scanning of large areas.

Furthermore, 3D FlatScan^TM stages can be incorporated with systems such as optical microscopes, Raman microscopes, SEMs/FIBs and environmental chambers for online operation, whereas conventional scan stages are too bulky and geometrically limiting. Its diminutive height of 7 mm allows for easy access with high-powered microscope objectives from either above or below the scanning stages

B) Breakthrough in Tuning Fork Feedback

• Provides ultra-sensitive phase and amplitude feedback with high Q-factors
• Normal force tuning fork feedback
• Allows for frequency modulation mode with high force constant
• Ultra-sensitive force spectroscopy modes free from jump-to-contact or ringing artifacts  
• Improved imaging quality
• Optically free feedback
• Friendly geometry for integration with optical microscopes
• Full operation in liquid cells
• Minimal adjustments required

Cantilevered nanopipette probe mounted in tuning fork operates on normal force sensing mode.

C) Tip and Sample Scanning Capabilities

 The MultiView 2000^TM was the first SPM system to incorporate tip and sample scanning capabilities using one SPM head. The thin height and friendly geometry of the 3D FlatScan^TM stages allow the user to join two stages on one SPM platform. A scan range of 100µm can be obtained with each scanner on the X, Y and Z-axes. Furthermore, combined scanning modes (XY sample scan- Z tip scan and XY tip scan- Z sample scan) are readily obtained to reduce XY and Z decoupled scans.

Tip scanning, sample scanning and combined scanning modes on one SPM platform allow for unique protocols in different applications, such as waveguide sample characterizations and Tip Enhanced Raman Spectroscopy, which will be further described in Applications section of this brochure

MultiView 2000TM tip & sample scanning SPM head (upper); sample scanning 3D FlatScanTM piezo XYZ stage  (middle) and tip scanning 3D FlatScanTM piezo XYZ stage (lower)

The distribution of light emanating from the edge of a waveguide can be better imaged by collection-mode tip scanning. In this case, the light is injected into the bottom of the waveguide through an inverted-microscope objective or an input fiber. The geometry of the light source and waveguide must be kept stationary throughout the measurement, and sample scanning would disturb the injection of light into the waveguide. Thus, tip scanning collection mode is preferred in this case and in similar experiments.

Unique NSOM/ANSOM and AFM/Raman/TERS Protocols

AFM/Raman

• Free optical axis with transparent glass probe allows for online AFM/Raman imaging. Pixel-by-pixel imaging is obtained for direct correlation of structural and chemical information.
  
• Improved far-field confocal resolution: Every pixel of the sample is rigidly maintained with the help of Z sample scan, held at the same distance relative to the lens with an accuracy of better than a nanometer. As a result, out-of-focus light is reduced, and improved resolution is obtained.
  
• Transparent glass probe with no Raman background
  
• Ultrasensitive AFM feedback from tuning fork without any optical interference

	Direct AFM/Raman correlation of carbon nanotube: (Top Left) AFM image of an isolated nanowire of carbon nanotube on silicon surface. (Top Right) On-line confocal Raman image shows G-band (1575 cm-1) distribution and the shifted G-band of the graphite aggregates (1580 cm-1) as illustrated in the plot (Bottom).

Tip Enhanced Raman Spectroscopy [TERS]

• A single gold nanoparticle TERS probe:
  - Artifact-free probe from scattered light, ordinarily observed with coated TERS tips
  - Transparent glass for free optical axis with any optical microscopes, including upright microscopes
  - No Raman background
  
  
• Combined tip and sample scanning modes for unique TERS protocols:
  - Raman difference protocols for isolated near-field and far-field effects
  - Off axis tip scan within the excitation laser spot for optimizing TERS signal
  
• AFM/Raman/TERS operation in liquid cells for biological applications

Tip enhanced Raman Signals (red) from Carbon nanotube sample (Left) and 15nm strained silicon layer on silicon bulk (right) obtained the same gold nanoparticle probe.

NanoPhotonics

• All NSOM and ASNOM modes of transmission, reflection, collection and fluorescence online with topographical measurements combined with far-field optics.
  
• Flexible geometry with free optical axis that is suitable for large samples and odd sizes including standing position of waveguides and optical fibers
  
• Tip and sample scanning protocols for tip/sample scanning and positioning, for optimized optical and topographic characterization
  
• Normal force sensing mode of tuning fork feedback with no optical interference
  
• Variety of NSOM probes including cantilevered bent probes of the Nanonics NanoToolKitTM probes, straight fiber probes and Si based NSOM probes.

On-line Topographic and Near-field Imaging of A Multi-Mode Optical Fiber: An optical fiber vertically mounted on MultiView 2000TM SPM head integrated with an upright optical microscope. The sample is kept stationary along the scan to prevent any disturbance of the light propagation through the fiber. Tip-scanning capabilities are ideal in such applications for true profiling of the optical output.

Upper left: AFM topographic image of a cleaved multimode optical fiber obtained with AFM/NSOM probe. Upper right: Correlating NSOM image in collection mode obtained simultaneously with AFM image. Lower: 3D AFM/NSOM collage of the output optical distribution, corresponding precisely with the surface's topography

NanoPlasmonics

• Optimized setup for plasmonics near-field and far-field excitation and collection with transparent optical integration from top, bottom and side illumination/collection.
  
• Convenient design and integration with lasers and optical instruments such as polarizers, analyzers, spectrometers, etc...
  
• Ultrasensitive Normal-Force sensing of a Tuning Fork feedback with no background due to optical feedback.
  
• Photon Scanning Tunneling Microscopy (PSTM) with non-perturbing coated and non-coated probes

Left: NSOM collection mode image shows light distribution from an array of 136nm holes and spaces in gold. Illumination from below and NSOM collection from above the aperture array. This array shows extraordinary transmission (EOT) of 40x a single 136 nm aperture.   3D Collage of the (Left) NSOM image correlated with the AFM topography. Notice that the distribution of light is more intense at the higher metal lines than in the apertures

Fountain Pen and NanoInkJet Lithography

• Capillary nanopipette probes for liquid and gas lithography with precise nanometric placement for addition and removal of chemicals at the surface of a sample
  
• Nanolithography with variety of "inks" on different surfaces with no chemical treatment. Complete freedom in choosing materials and surfaces with large reservoirs
  
• Electrophoretic lithography via electrical pulses for accurate and controlled chemical deposition
  
• NanoChemWrite^TM software for controlled-features lithography with convenient and customized scripting-based LabView software.
  
•  Full operation inside environmental chambers and flexible connection with chromatography

	Fountain Pen Nanolithography tuning fork probe filled with BSA protein liquid.
	AFM and SEM images show gold nanoparticle controlled deposition through NanoInkJet electrophoretic nanolithography.
	AFM image shows the inner electrodes pattern with a printed gold nanoparticles wire crossing a space of 100 nm between two electrodes produced by FIB. Right is I-V plot characterizing the printed line Ohmic conductivity

Liquid Cell Operation

• MultiView2000TM allows for bioAFM imaging in liquid cells with the ultimate in AFM feedback, using a tuning fork for soft-sample imaging and force-spectroscopy measurements.
  - Ultra sensitivity with high Q factors
  - Large force constants with no jump-to-contact and ringing artifacts; and with no damping in liquids
  - Frequency modulation and phase feedback with a separate channel for elasticity and adhesion force without the complications of soft cantilevers
  
• Flexible design of liquid cells suitable for integration with optical microscopes, including upright with water immersion objectives

Murine Stem Cells AFM/NSOM Imaging in Liquid. Online AFM topographic image (left) of murine cells sample and NSOM fluorescence correlated image

MultiView 2000^TM On-line Integrations

Transparent Optical Microscopy

• MultiView 2000TM allows for transparent integration with true confocal optical microscopy, including upright, inverted and dual configurations.
  
• Complete free optical axis from top and bottom with powerful objectives having large NA, including water and oil Immersion objectives
  
• Near-field and far-field optical measurements of NSOM transmission, reflection & collection, fluorescence, sSNOM and confocal DIC measurements

	Free optical axis of MultiView 2000TM allows for transparent integration with dual optical microscope configurations.

Integration Package

• Ultra stable platform for on-line hard optical coupling of an SPM with:
  - Raman
  - Fluorescence/Photoluminescence
  - Non-linear optics
  
• Optimal SPM performance with full isolation from on-line noises of Femto-second lasers and CCDs, as well as environmental noises
  
• Free optical axes of inverted, upright and 4pi configurations of optical microscopes with infinity corrected lenses that have parallel beams perpendicular to the sample stage

	Integration Package allows for complete isolation of MultiView 2000TM from noise sources with high optical throughput of hard coupling.

Raman Integration

• Direct mounting of MultiView 2000TM on various confocal Raman microscopes such as Renishaw PLC, Horiba Jobin Yvon and Bruker Optics.
  
• Free optical axis from top and bottom of upright and inverted optical microscopes for online AFM/Raman and TERS measurements

MultiView 2000TM mounted on HORIBA Jobin Yvon's Xplora Raman spectrometer	MultiView 2000TM mounted on Renishaw ‘s Invia Raman spectrometer

SEM/FIB/Ion Beam Integration

• Vacuum compatible SPM head for integration with SEM/FIB/ion beam systems
  
• Clear electron and optical axes for on-line AFM/NSOM with SEM/FIB/ion beam operation

Complete transparency of MultiView 2000TM inside SEM chamber.

Glove Box Integration/Environmental Control

• Sealed container designed to allows manipulation of the MultiView 2000TM head in a Glove Box for controlled atmosphere of inert gas, vacuum, humidity and chemicals.
  
• Transparent optical axis for integration with optical microscopy

Environmental chamber for MultiView 2000TM suitable for Glove Box integration with free optical axis. (Right) Environmental chamber scheme side and top view.

High Vacuum Integrations

• Compatible with high vacuum chambers with integration into optical microscopes and free optical axes from top and bottom
  
• Monitored humidity-control capabilities ranging from 5% - 95%
  
• Cooling to 4oC and heating to 40oC inside the chamber
  
• Inlets for additional environmental-control substances, including gas inlets
  
• Optical fiber inlets

Flexible integration of MultiView 2000TM inside high vacuum chambers with free Z optical axis.