•  Scanning Stage:
  - Awards winning optical friendly Nanonics 3D Flat Scan^TM stage.
  - Unprecedented large scanning area of up to 100 microns in X, Y and Z.
  - Suitable for odd size and large samples including hanging geometries. 
   
• Feedback:
  - Beam bounced optical feedback via quadratic positioning sensitive diode (PSD)
  - Visible (670nm) and IR (905nm) laser diode feedback
  - Tuning Fork feedback (optional)
  
  
• Probes:
  - All forms of cantilevered glass probes from Nanonics exclusive NanoToolKit^TM including:
  AFM, AFM/NSOM probes for transmission, reflection and collection modes, Electrical and Thermal Probes, Capillary nanopipette probes for nanolithography.
  - All forms of standard and commercial probes for AFM. MFM, nanoindentation, etc...
  
  
• Normal Force Sensing:
  MultiView 1000^TM employs Normal Force Feedback; the ultimate is SPM feedback for glass probes. Normal force sensing permits unprecedented control of the tip/sample separation, and flexibility of the NanoToolKit^TM cantilevered probes including NSOM fiber probes, capillary nanopipette probes, electrical and thermal probes. In addition, normal force allows friendly integration with upright microscopy with unobstructed optical axis. Nanonics is the only company that is able to provide cantilevered glass probes that work with normal force sensing and overcome the complexity of the alternative feedback methodology namely shear-force.
  
  
• Optical Integration:
  The unique geometry of the MultiView1000TM head and cantilevered probes leaves the optical axis free both above and below the sample for integration with upright, inverted and dual optical microscope configurations, allowing the user to view the tip positioning during scanning and to perform online AFM/NSOM imaging in reflection, transmission, and collection modes.
  
  
• Integration with Complementary Techniques:
  - MultiView 1000TM head with its modular and customized design allows for flexible online integrations with variety of instrumentations such as Confocal, DIC, etc.
  -MicroRaman Microscopes: Permits online correlation of SPM topographic, thermal, electrical properties of the sample with micro-Raman spectra and imaging.
  - SEM/FIB: MultiView 1000^TM can be transparently placed inside SEM/FIB chambers providing simultaneous AFM/SEM imaging.
  
  
• One Head: All Modes of NSOM
  - MultiView 1000^TM allows for online AFM and NSOM imaging with unique solutions for bridging near-field scanning optical microscope (NSOM), far-field optics and AFM nanocharacterization. All NSOM modes including reflection, transmission, collection are obtained in full correlation with the AFM and performed at the same head with no change of probe, SPM head, objective etc. The above is possible thanks to the following exclusive solutions:
  - Full integration with all forms of conventional microscopes including upright, inverted and dual configurations
  - Cantilevered NSOM fiber probes with normal force sensing technology, smallest apertures seizes and fully transparence to the Z optical axis from below and above.
  - Optically friendly 3D flat Scanner
  
  
• Available options for the MultiView 1000^TM
  - Close Loop Scanner: close loop operation for scanning and positioning.
  - Liquid Cell: Perform AFM/NSOM measurements on samples in liquids
  - Fountain Pen Nanolithography: MultiView 1000^TM uses capillary nanopipettes for accurate nanometric deposition of variety of materials.
  - 3D Nanolithography: Software to perform different lithography algorithms.
  - Environmental chamber: For environment control such as humidity, sample heating cooling, inert gas, etc.
  - Thermal and Electrical Measurements: Online AFM/Thermal or electrical imaging are obtained with numerous types of specialized SPM probes of coated and co-axial electrical/thermal probes.
  - NanoIndentation
  - Kelvin Probe Microscopy (KPM)
  - Magnetic Force Microscopy (MFM

  MultiView 1000^TM has a great advantage of a flexible design that incorporates 3D FlatScan^TM scanning stage and Nanonics' cantilevered probes. Such geometry of an SPM head allows for transparent integration with all kinds of upright, inverted and dual optical microscope configurations and thus creates ideal SPM/NSOM integrations with free optical axes. Because the MultiView1000^TM system readily sits on the sample stage of any conventional far-field microscope and is compatible with most commercial control systems, users can also incorporate the MultiView 1000^TM into pre-existing microscopy systems. Our in-house team of experts also works with each customer on a one-to-one basis to provide customized solutions that suit the particular requirements of the research to be undertaken.

MultiView1000TM Scheme	MultiView1000TM side view	MultiView1000TM top view

Transparent glass probe	3D FlatScanTM Scanning stage

Probes

The standard probes used in Nanonics systems are cantilevered optical fibers. They provide for normal force feedback, have unique advantages in permitting a second channel of illumination or collection, and allow transparent, integrated and simultaneous far-field, lens-based imaging.

 Straight NSOM fiber probes, micromachined cantilevered NSOM probes and standard, silicon AFM probes can also be used with the MultiView 1000^TM. In addition, Nanonics produces customized fiber probes to customer specifications, such as probes with tip lengths greater than 500 mm for deep-trench probing and probes with unique force constant and resonance frequency combinations.

Large Z Scan Range

  The large, 70-micron x, y and z-range of the Nanonics 3D Flatscan^TM makes it ideal for optical sectioning in confocal imaging. Used in this way, the MultiView 1000^TM integrates conventional far-field imaging, confocal microscopy, AFM, and near-field optics in a single system.

AFM topographic image of 64.5um Z range obtained with the MultiView 1000TM

Closed Loop Option

With the inclusion of embedded closed loop sensors, the  Nanonics 3D Flat Scanner can return the sample to a precise spot with an accuracy of 20 nm. This is unaffected by hysteresis, creep, non-linearity or aging of the piezoceramic. Therefore, the MultiView 1000^TM with closed loop sensors can perform linearization of the scanner both on-line and off-line during a scan.

Closed loop 3DFlatScanTM scanning stage

Overall, the MultiView 1000^TM is a robust and versatile SPM system which allows the user to zoom, with overlapping fields of view, from the lowest resolutions of conventional Far-field imaging to the higher resolutions of confocal microscopy, and finally, to the ultimate resolutions of AFM and NSOM.

One Head: All Modes of NSOM

MultiView 1000^TM allows for online AFM and NSOM imaging with unique solutions for bridging near-field scanning optical microscope (NSOM), far-field optics and AFM nanocharacterization. All NSOM modes including reflection, transmission, collection are obtained in full correlation with the AFM and performed at the same head with no change of probe, SPM head, objective etc. The above is possible thanks to the following exclusive solutions:

• Full integration with all forms of conventional microscopes including upright, inverted and dual configurations
• Cantilevered NSOM fiber probes with normal force sensing technology, smallest apertures seizes and fully transparence to the Z optical axis from below and above.
• Optically friendly 3D FlatScan^TM Scanner

All Modes of NSOM

 

 

There are four possible NSOM modes of operation:

Transmission Mode Imaging: The sample is illuminated through the probe, and the light passing through and interacting with the sample is collected and detected.
Reflection Mode Imaging: The sample is illuminated through the probe, and the light reflected from the sample surface is collected and detected.
Collection Mode Imaging: The sample is illuminated with a macroscopic light source from the top or bottom, and the probe is used to collect the light from the sample surface.
Illumination/collection mode imaging: The probe is used for both the illumination of the sample and for the collection of the reflected signal.

Detection of the collected light can be achieved with a wide variety of instruments: an Avalanche Photo Diode (APD), a Photomultiplier Tube (PMT), an InGaAs Detector, a CCD, or a spectrometer. The signal obtained by these detectors is then used to create an NSOM image of the surface. In addition, Nanonics' unique cantilevered glass probes have no Raman background - as opposed to silicon probes - and have completely transparent, exposed AFM tips.

A: Topographic AFM image of a Photonics Band Gap (PBG) structure, imaged with a 150nm AFM/NSOM cantilevered probe	B: Online correlated NSOM image of the PBG structure at (A). Imaged with the same probe in reflection mode at a 532nm laser wavelength

  The movie shows changes in the reflected laser intensity (small green spot) as collected by the lens of an upright optical microscope from above. The intensity alteration occur as the probe is kept in the near-field by AFM feedback while the sample is scanning

Other Applications

MultiView 1000^TM Online Integrations

Optical Integration

The first SPM That Can Be integrated into Upright, Inverted & Even 4 Pi Optical Microscopes Which are the Most Advanced Form of Optical Microscopy

MultiView 1000TM on a Standard Upright Microscope	MultiView 1000TM on a 4Pi Dual Microscope	MultiView 1000TM on a Standard Inverted Microscope

Raman Integration

MultiView 1000TM directly mounted on Renishaw Invia Raman Spectrometer.

On-line & Simultaneous AFM and Raman:

• Raman intensities for the first time can be effectively compared with AFM based autofocus
• Significant resolution improvements are achieved even without near-field techniques
• Other on-line advantages
• Surface enhanced techniques can be transparently applied

See more about Raman AFM/Raman

 

SEM/FIB

Complementary and transparent on-line operation of both SEM and AFM imaging techniques in one system allows for a synergism of operaiton for example rapid SEM placement of the SPM probe over a large field, verification of the integrity of the probe, on-line electrical measurement of nanostructures for on line carrier concentration and other nanocharacterization tasks as delineated in this presentation.

MultiView 1000TM inside SEM	Clode-up View	Free optical axis inside SEM

  

Environmental Chamber

The Nanonics EnviroView 1000^TM is built upon the unique technology of the Nanonics MultiView 1000^TM microscope. Nanonics EnviroView 1000^TM allows for controlled environmental of the NSOM or SPM system that has a completely free optical axis and can be integrated with all modes of optical microscopy

• Precise humidity control
• Unobstructed optical axis
• Gas inlet port
• Chemical Delivery by nanopipette
• 10-6 Torr High Vacuum Chamber
• Transparent integration with any optical microscope, including dual microscopes
• Complete freedom of optical microscope nose piece rotation