| Optometronic 4000 |
|
Awarded the R&D 100 Award 2007 & Semiconductor Int'l 2007 Editor's Choice Award
 |
Nanonics carries nanophotonic characterization to new heights with The OptometronicTM 4000. Photonic and plasmonic characterization today requires multiple functionality in one platform that can be added transparently and with modularity. This singular platform integrates Nanonics' revolutionary Multiprobe Near-field Optical & Atomic Force Capabilities with Nanonics' State of the Art Lensed Fibers and Highly Compact Lensed Fiber NanoManipulators that bear the mark of excellence and innovation that is Nanonics. |
Main Applications of the OptometronicTM 4000
|
- Analyze plasmonic waveguides and plasmonic structures.
- Inject and analyze light in state of the art waveguides and optical resonators - such as those fabricated in silicon - with unprecedented AFM control and stability.
- Profile a state of the art lensed fiber, as well as other challenging beam profiling tasks with nanometric resolution in the near and far-field.
- Obtain true M2 values, top hat flatness analysis, uniformity of holographic patterns and active allignment with defined intensity positioning.
- Measure a refractive index profile.
- Characterize a photonic band gap crystal, or a vertical cavity, or quantum wire laser, or a quantum dot.
- Analyze arrayed waveguides with AFM nanometric positioning and feedback and ultra high 0.02 dB stability.
- Nanomanipulate plasmonic particles with multiple probes.
- Write plasmonic structures.
- Investigate other quantum structures such as quantum dots.
- Investigate systems with apertureless near-field scanning optical microscopy with the OptometronicTM 4000's ability for tip illumination from all angles.
|
|
|
Free Optical Axis from Above and Below and from Each Side Allows the Ultimate in Illumination Protocols |
|
|
 |
Even with an
Environmental Chamber in Place, the Ultimate in AFM Performance is Achieved. |
System Description
Multiple near-fied optical and atomic force microscopes for controlled pump probe optical measurements.
- Interchangable near-field optical and atomic force microscope heads with fiber nanomanipulators.
- Each head individually controlled and scans one near-field optical probe or other AFM sensor.
- Each nanomanipulator individually controlled.
- Rough and fine sample scanning for device nanometric positioning or scanning.
- Completely free optical axis.
- Inject light with an inverted microscope.
- Inject light with a dual microscope.
- Exceptional quality lensed fibers with near-field optical and atomic force quality control.
- Environmental control available.
- General NSOM and AFM capabilities including all standard AFM modes of operation and collection, reflection, transmission, Illumination NSOM modes.
- Ideal for apertureless near-field scanning optical microscopy with the OptometronicTM 4000's ability for tip illumination from all angles.
- Integrate your laboratory into the OptometronicTM 4000 using LabView based software routines.
- Analyze on-line with Raman Spectroscopy and Tip-enhanced Raman Spectroscopy (TERS).
|
|
A Single Atomic Step in Highly Ordered
Pyrolitic Graphite (HOPG)
|
The OptometronicTM 4000 Technology Incorporates Many Nanonics' Innovations:
1. The Solution to the Scanning Problem: Optically Friendly 3D Flat ScanningTM
3D Flat ScanningTM Technology was developed to provide for optically friendly SPM scanning systems. These Flat ScannersTM are based on the same scanning mechanism of all AFM piezo scanners. However, four such piezos are used in a patented geometry that provides a free optical axis.
These SPM scanning systems also provide a large, 70 micron, seven times larger than most AFM sytems. Such a Z range connects well with confocal imaging.
Also mm of rough scanning that is electronically controlled with the same, 7 mm thin, SPM piezo scanner and this is ideal for rapidly finding in the optical microscope regions of interest in a sample.
The 3D Flat ScannerTM provides:
- >20 mm clear optical axis
- 7 mm thin scanner
- mms of rough scanning and 100 micron of fine scanning in X, Y and Z directions
|
|
|
|
2. Optically Friendly Cantilevered Optical Fiber Probes that Do Not Obscure the Optical Axis:
Nanonics has developed solutions to both the probe and the scanning problems of standard AFM Systems. This solution uses a cantilevered transparent optical fiber probe. All such probes have their tips exposed to the optical axis and the axis is kept completely free for a variety of optical microscopic protocols that require a free optical axis.
Nanonics' Spatially & Optically Friendly Probes
|
|
standard probes
|
 |
|
From the state-of-the-art and beyond, the OptometronicTM 4000 addresses today’s challanges. This modular platform enables the ultimate near-field and far-field characterization of light correlated with surface topography. The Nanonics OptometronicTM 4000 defines a new world of ultra high resolution and ultrasensitive light wave characterization that can be transparently integrated with standard light wave characterization analyzers through Nanonics' Fiber Optic Interface.
The entire platform with dual microscope sits on a passive platform from Minus K technology. All motions down to 0.5 Hz are effectively prevented.
|
|
3. Normal Force Tuning Fork Feedback
The Optometronic 4000™ employs the ultimate in SPM feedback technology. Normal force tuning fork technology with high Q factor phase feedback is used to permit unprecedented control of the probe tip/sample separation. Tuning forks in normal force mode with phase feedback not only permit the best AFM imaging available today but, in addition, there are no user adjustments needed with such a feedback mechanism. This allows for ease of operation with the ultimate in AFM resolution, better than any beam bounce technology. Furthermore, there is no feedback laser interference, for example, when working with semiconductor devices or fluorescent materials.
|
|
 |
Thus, Nanonics' Systems Incorporate Many Innovations.
Each Probe and Sample is Individually Controlled
With the MultiView Multiple Probe Systems it is possible to scan each tip or the sample independently. This allows multiple probes to be brought in close proximity one to another and can allow multiple probes to perform separate functions simultaneously as a function of distance between the probes.
Sample Scanning with Multiple Probes in Individual AFM Feedback Defines the Distance Between Probes.
First Probe Second Probe
|
X position: 4.6
Y position: 1.3 of circled dot
Probes X Offset: 1.9 µ
|
|
X position: 2.9
Y position: 1.0 of circled dot
Probes Y Offset: 300 nm
|
Exposed Probes and Sample Scanning Allow Ultraclose Approach.
|
Independently controlled probes in AFM feedback and in contact
|
|
- Exposed Probe Technology allows for ultraclose approach of multiple probes.
- Independent scanning of each probe allows for X and Y offsets for each probe to be used in feedback to bring the probes into contact while the sample continues to scan.
|
Cantilevered Fiber Probes are Ideal for Photonics.
|
- They combine the ease of normal force AFM control with the waveguiding nature of fiber probes,
- Allowing for near-field scanning of the probe independent of sample scanning,
- Permitting excellent collection mode NSOM which is critical in photonic device characterization.
- Transparently integrate with Standard Light Wave Characterization Equipment.
|
|
 |
The Optometronic 4000TM Interconnects Near-field Optics with the Worlds of NanoAlignment and Tests & Measurements.
|
|
|
Nanonics' systems interconnecting cantilevered fiber optic probes with nanometric sample scanning stages can also be transparently integrated into light wave measuring systems.
|
Couple Light with Nanonics' State of the Art Fiber Lenses
|
|
|
|
|
Nanonics' 3D Collage of AFM Topography and Collection Mode NSOM of an Integral Fiber MicroLens
|
|
 |
Investigating Fields, Phase and Band Structure of Photonic Components
Single Probe Nanonics NSOM/SPM Systems also Designed for State of the Art Photonic Device Characterization
The MultiView 2000
| Standard NSOM/SPM platforms either move probe or sample but this is not enough for Photonics. Nanonics' MultiView systems interconnect cantilevered fiber optic probes with its ultrastable atomic force feedback and unique nanometric resolution flat scanning stages for both sample and probe independent movement. In the MultiView 2000 system the top scanner holds the probe while the lower scanner holds the device under test that is to be characterized. The MultiView 4000 systems allow for more than one probe for pump probe experiments or for optical and thermal profiliing correlated with sample topography. Also the MultiView systems are fully functional scanned probe imaging microscopes that can be transparently combined with all fiber optic devices including waveguide characterization systems and fiber optic interferometers. They thus bring the advantages of SPM and NSOM to Photonic Device Characterization. They also combine with any standard optical microscope and can be combined with dual microscopes that are very important for viewing photonic devices such as hanging waveguides from the top and the bottom for ease of injection and collection of light even into silicon waveguides. |
|
|
|
 |
Phone: +972-2-6789573 |
Fax: +972-2-6480827 |
USA Toll Free (direct to sales): 1-800-289-7162 |
|
|
|
|
| Fiber Microlens |
 |
| Topography and light distribution from near-field and far-field on-line. |
|
|
| Pump Probe Illumination Collection |
 |
| Injected light is guided through a fiber and can be collected and analyzed both spatially and temporally. |
|
|
| NSOM of the Edge of a Waveguide |
 |
| Spatially correlating the launching of light and resulting emitted mode structure. |
|
|
| NSOM/AFM Collage |
 |
| Evanescent fields in specialized resonator structures. |
|
|
| Optical Zoom on Nano Array |
 |
| Near-field characterization in contact. Non-uniformity in the x direction is due to the finite size of the array. |
|
|
| 3.1x3.1um Image in a PBG Structure |
 |
| Zooming-in with AFM on a Photonic Band Gap structure. |
|
|
| Selective Protein Deposition |
 |
| In a single hole of a 1.5 micron PBG. |
|
|
| High Current 50 mA NSOM & AFM |
 |
| As the injection current is increased the laser heats up and there is an alteration in the topography of the laser which alters the light distribution. |
|
|
| Plasmonics |
 |
| New horizons in Plasmonics using Nanonics Optometronics systems |
|
|
|
|
+
