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Unique experiments

Nanonics shares with its customers the passion for new developments and discoveries in fundamental science and technology. To this effect, in many cases we do more than simply supply SPM or NSOM systems. We work together with our customers to design and supply unique system configurations that enable the researcher to work with new and unique experimental setups. Our enthusiasm for advances in fundamental science results in a close cooperation with our customers and the work they are undertaking. The broad scientific knowledge base at Nanonics is put at the disposal of our customers both before purchase and just as importantly after delivery of the customer's system.

Below we have decided to list some of the various areas of research where we can provide expert knowledge of unique experimental set-ups and methodologies where customers can seek out our advice.

Nanonics systems and their various configurations are designed to provide the correct experimental set-ups in order for customers to undertake such research. Should you be interested in finding out more detail on any of the experiments in the list below, simply click on the link and an email from you will be sent with the experiment described in the subject heading. We will then get back to you shortly with more information.


How to:

probe the conductivity of pores in a porous material with scanned probe microscopy?   combine patch clamping with scanned probe microscopy?
 
 
monitor near-membrane calcium concentrations? monitor the ionic concentration above a surface or membrane?
 
 
monitor small invaginations in the surface of a cell membrane? profile deep trenches with aspect ration of 60:1?
 
 
monitor the chemical constitution of a then film without interference from the substrate? image the chemical homogeneity of polymer blend as a function of depth (depth profile)?
 
 
image the chemical alteration of a contact lens and correlate it with its topography? monitor the distribution of a drug on a cardiac stent correlated with its topography?
 
 
characterize and profile the tip of a razor blade? characterize strained silicon with nanometric resolution?
 
 
use an on-line AFM improve Raman resolution? How does an on-line AFM allow for accurate Raman intensity comparisons in spite of surface topographic artifacts?
 
 


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