 | | Tallarida, G. Imaging P-N Junctions by Scanning Near-Field Optical, Atomic Force and Electrical Contrast Microscopy
Laboratorio MDM-INFM |
| | | | Near-field Scanning Optical, Atomic Force, Scanning Resistance, and UV Confocal Microscopy in the Failure Analysis of ULSIs Produced with the Most Advanced Sub-Quarter Micron Design Rules
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| | | What is the AFM / NSOM Difference?
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| | | | Transparently combining SEM, TEM & FIBs with AFM/SPM & NSOM
A Nanonics Imaging Solution Issue 2.3 |
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| | | Dekhter, R. et al. Investigating Material and Functional Properties of Static Random Access Memories Using Cantilevered Glass Multiple-Wire Force-Sensing Thermal Probes
Applied Physics Letters Vol. 77 No. 26: 4525-4427 |
| | | | Lewis, A. et al. Failure Analysis of Integrated Circuits Beyond the Diffraction Limit: Contact Mode Near-Field Scanning Optical Microscopy with Integrated Resistance, Capacitance, and UV Confocal Imaging
Proceedings of the IEEE Vol. 88, No. 9: 1471-1479 |
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| | | Lewis, A. et al. Fountain Pen Nanochemistry: Atomic Force Control of Chrome Etching
Applied Physics Letters Vol. 75, No. 17: 2689-2691 |
| | | | Lieberman, K. et al. Near-Field Optical Photomask Repair with a Femtosecond Laser
Journal of Microscopy Vol. 194, No. 2/3: 537-541 |
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