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Materials and Surface Nanoscience Online AFM/Raman of an Si/SiO2 Grid AFM/Raman of Cardiac Stent Topographic Images of the Fisher's Sample Collage of Raman Intensity & AFM Topography of a Diamond Film Raman Imaging with AFM Auto-Focus AFM Phase Images of TMP Sample Raman/AFM Depth Profiling of a Polymer Blend/PDMS/Chloroform NanoIndentation and Raman Characterization AFM with On-Line Raman of Strained Silicon AFM/Raman Collage of Name Card AFM/Thermal in Non-Contact Mode Topographic Imaging of Silver Nanoparticles AFM Raman of CNT Nanowire on Silicon MultiProbe NanoIndentation & AFM Profiling with On-line Raman AFM/Raman of Strained Si Transistor Large Z-Range Imaging of Razor Blade Off-Axis Enhancement Quantum Dots Imaging Quantum Dots Imaging AFM/Raman of Si/SiO2 Grid Diamond Film Raman with AFM On-Line Auto-Focus Grain Boundary Imaging in HOPG FIB Etched Trench AFM Imaging of Textile Fibers Optoelectronic Device Structure HOPG Carbon Nanotubes Wood Sample Nanoindentation 0.5x0.5µ Carbon Nanotubes PEO Spherulite Raman-AFM of MEMs device TFT in Liquid Crystal Display Magneto Optic Disc SEM/AFM Integration AFM, NSOM and Capicatance 30nm Gold Balls Internal Imaging of a Deep Trench Alumina Template Deep Trench / Side-Wall Imaging Zoom on Carbon Nanotube Simultaneous AFM/NSOM and Capacitance Carbon Nanotubes Topographic Imaging of Silver Nanoparticles Quantum Dots Imaging	Image of Standard Silicon AFM Tip Standard Silicon Tip Imaged by an Optical Fiber AFM Probe 2D AFM image of the tip area approximately 15µm x 15µm 3D Topographic Image of standard Silicon tip measured by AFM in the intermittent contact mode of operation    These images were produced by the Nanonics MultiView 1000™ with an optical fiber probe in the intermittent contact mode. Only the Nanonics optical fiber AFM probes have high enough aspect ratios (10:1) and are narrow enough to image the structure of a standard Silicon Probe. Cantilevered AFM Probe: note that the angle of the cantilever enables viewing the sample underneath the AFM tip Sketch of  AFM Probe   Phone: +972-2-6789573 Fax: +972-2-6480827 USA Toll Free (direct to sales): 1-800-289-7162 Patch Clamping | Photonic Band Gap | atomic force microscopy | scanning probe microscope | near field optics | NanoLithography Copyright @ 2007 Nanonics Ltd. All rights reserved to Nanonics- SNOM | AFM raman | Contact Us Name: E-mail: Institution: Phone: Select Country: ---IsraelUSIndiaUKGermanyChinaFranceCanadaS. KoreaJapanOther Area of Interest: ---AFMAFM/RamanMultiProbe AFMNSOMOther Type in the image characters: I would like to receive the newsletter