| Hydra Bio-SPM – A New Generation of Bio AFM |
 Awarded Microscopy Today's 2010 Innovation Award
General Description
The HydraTM is a new revolution in the BioAFM market that allows integration with any upright or inverted microscope. The Hydra'sTM open design can be integrated into any microscope (unlike other BioAFMs which are limited by geometric or optical obstruction), including advanced concepts in optical microscopy such as 4pi configurations and many non-linear optical protocols.
The HydraTM incorporates tuning fork feedback mechanism, which provides UltraSensitive Liquid CellTM operation for new sensitivities in AC force spectroscopy. Its Tuning Fork Liquid CellTM also permits Nanonics to offer MultiProbe Atomic Force Microscopy to the BioAFM researcher allowing for new directions in BioAFM imaging and nano-manipulation.
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Key Features Technology Breakthrough Online Integrations Applications Specifications |
A New Class of BioSPM
- The only BioSPM that permits independent and simultaneous multiprobe operation.
o Up to 4 SPM probes
o Multifunctional probes for manipulation and imaging
- The onlyBioSPM that permits critically acclaimed tuning fork feedback in liquid.
o Ultra soft contact high Q-factors
o Improved imaging quality
o Optically free feedback ideal for fluorescence
o Permits ultrasensitive AC dynamic force spectroscopy
- The only BioSPM that can integrate with any optical microscope.
o Upright
o Inverted
o Dual 4pi Configurations
o Raman/Confocal/DIC/NSOM
- Liquid cell without optical and mechanical constraints or interference.
o Compatible with all biological sample preparation
- A NanoTool KitTM of multifunctional probes for multiprobe operation.
o Conductance & Patch Clamping
o Apertured & Apertureless NSOM
o Single Gold Ball Tipped Probes
o BioMolecular Nanolithography
- All probes non-optically interfering
- Tip or Sample Scanning with AFM Autofocus for Confocal Imaging
o Z range of 100 µm Unachievable with any other SPM
o Humidity/Temperature/Vacuum
o Retaining full optical transparency
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A Ground-Breaking Advance in AFM Bio-Imaging in LiquidsComparison list between Nanonics Hydra and standard BioAFMs:
| Standard BioAFMs |
Nanonics HydraTM |
| Beam Bounce Feedback |
Tuning Fork Feedback |
Poor Sensitivity due to Feedback Effects
- Soft Cantilever with low spring constant
- Low Q-Factor
- Severe damping
- Jump-to-contact and ringing effects |
Ultra-Sensitivity using Dynamic Methods of Frequency Modulation.
- High Force Constant
- High Q-Factor
- No damping and No Jump-to-contact in liquid |
| Optical Interference |
No Optical Interference |
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Strict requirements for optical purity of the feedback laser reflection.
- Imposes severe limitations on liquid cells and scanning stages
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Flexible geometry with:
- Free optical axis from top and bottom
- Uses Water Immersion Objective
- Standard petri dish
- Tip and sample scanning
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| Single Probe AFM Systems |
On Line MultiProbe SPM Operation:
- Optically and Spatially friendly
- Uses Nanonics' NanoTool KitTM of multifunctional probes for multiprobe operation |
| Severe geometric obstruction for online integrations. |
Flexible Integration with online complementary techniques such as Raman, FTIR, DIC, Confocal, etc.
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UltraSensitivity for Imaging Soft Samples in Liquid
Tuning Fork Feedback for AFM operation in Liquid:
- High Force Constants
- High Q Factors
- No Damping
- No Jump-to-Contact
- Allows for dynamic method of frequency modulation (Ideal for Force Spectroscopy)
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Complete Optical Transparency
Nanonics unique 3D FlatScanTM stages and Cantilevered NanoToolKitTM Glass Probes allow for transparent optical axis from top and bottom and for flexible integration with all types of optical microscopes.
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| The Ultra Thin Transparent Glass Tip with a High Cantilever Structure prevents any optical interference even in DIC. DIC images show PC 12 Cells during AFM imaging In and Out of focus. The In-focus image shows a clear optical axis without optical interference. |
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| A Free Optical Axis From the Top even with a water immersion objective. Schematic is pictured (left) and a 40x objective is shown in middle picture. Such objectives have ultra-low working distances as small as 3.5 mm that provide high numerical apertures of up to 0.8. The image shown at the right depicts the side view of a tuning fork immersed in liquid during an AFM scan. |
MultiProbe SPM
Glass Probes are Optically & MultiProbe Friendly
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| On-line control of multiple probes: Not only are they optically & spatially friendly, but they also permit UltraClose approach |
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Optical Microscopy
Free optical axis from above and below
Integration with Upright, Inverted and Dual optical microscope conffigurations.
High Magnification objectives with large NA including Water Immersion Objectives from above.
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| Hydra Integration with Dual Optical Microscope |
Short Working Distance of the Hydra with Tuning Fork feedback allows for integration with Water Immersion Objective from above. |
Spectral Packages
- Confocal fluorescence imaging and lifetime confocal Raman
- Confocal Raman
- Tip Enhanced Raman Scattering
- Total internal reflectance fluorescence
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Fully integratable with all microscopes including Raman Spectral Microscopes
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Environmental Control
- Humidity/Temperature/Vacuum
- Retains full optical transparency
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| MultiProbe Hydra Environmental Chamber mounted on Dual optical microscope |
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Modes Of Operation
| AFM |
AC Mode
Contact Mode (Optional)
All AFM Modes of Operation with probe or sample scanning |
Near-field
Optical Imaging & Illumination |
Transmission, Reflection, Collection, Illumination |
| Differential Interference Contrast |
Reflection and Transmission |
| Refractive-Index Profiling |
Reflection and Transmission |
| Thermal Conductivity and Spreading Resistance Profiling |
Contact or AC mode
No Feedback Laser Induced Extraneous Carriers in Semiconductors with tuning fork feedback option |
On-line Far-field Confocal with
Raman and Fluorescence
Spectral Imaging |
Reflection and Transmission
Tip Enhanced Raman Scattering for Selective Raman Scattering of Ultrathin Layers such as Strained Silicon |
| NanoLithography |
NanoFountainPen delivery of chemicals and gases; Near-field photolithography; and other conventional means of nanolithography such as electrical oxidation etc; with on-line analysis with an additional probe |
| NanoIndentation |
Application of MegaPascals of force, allowing exact positioning and controlled application of force with on-line analysis with an additional probe. |
| All the above modes of operation are provided fully integrated with on-line AFM imaging. |
SPM Scan Head Specifications
| Sample Scanner |
Piezoelectric Based Flat Scanner (3D Flat Scanner™)
Height 7mm
Suitable for Variety of Scanning Stages open and closed loop. |
| Probe Scanner |
Up to 4 independently controlled piezoelectric Flat Scanners (3D Flat ScannerTM) modules
Height 7mm
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| SPM Scan Range |
30 microns (XYZ) for each probe scanning module
100 microns (XYZ) sample scanning only
130 microns (XYZ) with sample and probe scanning
160 microns (XY) with sample and two probe scanning |
| Scanner Resoluton |
Z : 0.002 nm XY : 0.005 nm |
| Feedback Mechanism |
Ultra sensitive tuning fork feedback with high Q-Factor |
| Sample Geometries |
Sample size: Up to 16 mm standard
Up to 34 mm for upright microscope operation
Up to 55 mm without sample scanning
Custom sample sizes up to 200 mm also available
Liquid cell sample:
- Standard petri dish
- Modified liquid cells with different cover slips size
Unconventional Geometries: Hanging samples for edge profiling and other unconventional geometries possible. |
| Probes |
All forms of cantilivered glass probes from Nanonics' exclusive NanoTool KitTM, NanoSensors including Akiyama tuning fork probes and Si probes. |
Imaging Resolution
| Far-field |
Diffraction Limited |
| Optical |
Optics providing 500 nm diffraction limited non-confocal operation |
| Confocal |
200 nm |
| NSOM |
100 nm on installation; 50 nm probes available |
| Topographic |
Z noise 0.05 nm rms.
X.Y lateral resolution: convolution of tip diameter & sample |
| Thermal |
From 100 nm |
| Resistance |
From 25 nm |
Thermal & Resistance Imaging
| Temperature |
300 o C or greater, depending on sample to be investigated |
| Thermal |
Unique exposed tip dual platinum nanowire probes fully insulated with glass coating:
Thermal Sensitivity 0.01 ºC
Measured Resistance Change per degree; 0.38 Ω/ºC |
| Resistance |
Unique exposed tip platinum nanowire probes fully insulated with glass coating, allowing for coax geometry structures:
Ultra high electro potential resolution.
Few tens of ohms contact resistance for probes <100nm.
Electrically stable & free from oxidation. |
Electronics & Software
| Control System |
Integra Controller Specifications
Supports various imaging modes including AFM (contact and non-contact), phase, error signal and NSOM.
Up to 8 data channels can be read and imaged simultaneously.
All ADCs are 16 bit and DACs have16-bit resolution.
Image size continuously variable from 2x2 to 1024x1024
Inbuilt lock-in amplifier
There are two alternative software packages available:
Quartz Software Package Specifications:
User-friendly 32-bit Windows application available for Windows 95/98, NT and XPIntuitive scan parameter setup
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Image and line profiles displayed in real time
2-D and 3-D image rendering
Extensive image processing options
Comprehensive image analysis features including: cross section, particle analysis, fractal analysis and z-data histogram
Import data as Windows bitmaps and ACSII.
Export data as TIFF and Windows bitmaps and ACSII.
LabView Software Package Specifications:
User-friendly LabVIEW SPM based software for PCI-7344 with the following specifications:
AUX Data acquisition
Image and line profiles displayed in real time
Intuitive scan parameter setup
Open Design enabling customization by user and interfacing with other LabVIEW modules. Nanonics Controller and software package based on Windows XP and Windows.
XP LabView based software package: Real time image display, image acquisition up to 8 channels. Full access to all signals and readily integrated with external signals from other sources. Analysis software including all standard image processing routines and 3D rendering including collages of multiple signals.
Software modules available for spectral acquisition and analysis including Raman and fluorescence spectra, nanoindentation, nanolithography including
NanoChemwrite™ Fountain Pen NanoChemistry™ software suite.
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| Data Acquisition |
From 2x2 to 1024x1024 and multiple Z acquisition |
| Analog Lock-in |
Provides quadrature output. Information is readily available on R/? and I/Q in
output bandwidths of 15kHz (depending on DT card in use; the controller can
give up to 100 kHz). |
| Frequency Synthesizer |
Direct Digital Synthesizer (DDS) system for frequency and phase adjustment with 32-bit frequency determination and 20-bit phase determination. This system uses three independent generators. Two of these generators provide quadrature for lock-in processing and the third generator is used for exciting with an autophase algorithm. The system uses a clock frequency of 20 MHz with a stability of 5 ppm and provides frequency resolution of <5 mHz. |
| Amplitude |
0 to 5 V p-p and maximum resolution of up to 0.2 mV Amplitude, Phase and Frequency of the oscillator can be controlled with 100 kHz updates. |
| X, Y, and Z High Voltage Outputs |
-145V to +145V |
On-line Optical and Electron/ Ion Optical Integration
| Type |
Far-field, Confocal Optics, Near Field, micro-Raman; Scanning Electron Microscope (SEM) or Focused Ion Beam (FIB) |
| Integration |
Free optical axis from above and below the sample for on-line optical or electron/ion optical characterization. Integration with all forms of optical microscopes including upright microscopes and upright microscope probe stations. Integration with all standard microRaman 180 degree backscattering geometry configurations, inverted microscopes and state of the art dual (4Pi) microscopes, such as Nanonics unique dual microscope. All conventional far-field optical modes of operation are available, including phase imaging and differential interference contrast. NSOM with any optical microscope including upright, inverted and dual. The completely free optical axis from above and below in all Nanonics MultiView Systems also allows for integration with (4Pi) dual microscopes for non-linear optical techniques including second harmonic and sum frequency generation microscopes, third harmonic imaging, coherent anti-Stokes Raman microscopes and stimulated emission depletion microscopy. All Nanonics Systems and all Nanonics Multiple Probe Systems are unique
scanned probe microscopes with a completely free axis above the sample and
thus can be integrated transparently into scanning electron microscopes including field emission SEMs or focused ion beam systems. |
Minimum Working Distance (WD) with High Numerical
Aperture (NA) Optical
Microscope Lenses |
Upright Microscope or SEM or FIB:
Optical Objective: 100 x 0.75NA
Objective WD: 4.8mm Inverted Microscope:
All available objectives including oil immersion optical objectives |
| Detectors |
Photomultiplier Tube, Avalanche Photo Diode or InGaAs Detectors |
| Lasers |
Variety of lasers can be used from deep UV to near-IR |
| Video system |
On Line CCD video imaging |
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Phone: +972-2-6789573 |
Fax: +972-2-6480827 |
USA Toll Free (direct to sales): 1-800-289-7162 |
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