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| Polished nanopipette probe for NSOM Lithography and IR / deep UV operation |
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These probes are useful for high peak power laser pulses and can be used in the IR and very deep UV regions where regular fiber probes do not transmit, for example, 10 micron IR wavelengths or vacuum UV wavelengths below 180nm. These probes have a high threshold for damage making them especially useful for nanolithography and for highly localized metal removal using femtosecond laser pulses.
These probes are not recommended for general imaging applications because they can generate higher noise levels due to their immobility, lack of waveguiding and inability to view the probe tip on line.
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