| Free Space Interconnect Light Wave Measurement |
Optometronic 2000™ Integrated Optical Test & Measurements
Nanometrically aligned active feedback with super-resolution imaging
- Multiple Waveguides: 100 or more
- Multi-channel Waveguides
- Photonic Circuits
- Optical Amplifiers
- Active Components
- Free Space Interconnect
- No Pigtailing for Light Injection or Collection
- Rapid Active Feedback Optimization
- Stable to 0.02 dB
- Repeatable to 0.02 dB
- Reconfigurable to 0.02 dB
- Nanometric Alignment
- Approach to contact <1 second
- Reconfigurable in seconds
- Independent nanometric positioning of device under test (DUT) and probe fiber with on-line pre-alignment imaging
- Simultaneous Multi-parameter Super-Resolution Profiling
- Far-field/Near-field/Evanescent Fields
- Light Leakage
- Topography
- Thermal
- Electrical
- Sensitivity of -70 dBm
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System Specifications
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On-line Optics |
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Type |
Far-field, Near-field and Confocal Optics |
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Accessibility |
Free optical access along all axes for far-field observation, including from the direction of the probe fiber and the DUT and all perpendicular directions to the probe fiber/DUT axis. |
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Detectors |
InGaAs detector for Telecom Wavelengths, Avalanche Photodiode (APD), Photomultiplier Tube (PMT) |
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Video System |
On Line Video with Sensitivity to 2 µ, CCD |
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Operating Modes |
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Far-field Confocal & CCD Profiling |
Transmission, Reflection, Collection |
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Near-fieldOptical Profiling |
Transmission, Reflection, Collection |
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Refractive-Index Profiling |
Transmission and Reflection |
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Topographic Profiling |
Contact or Non-contact |
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Thermal and Resistance Profiling |
Contact |
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Active Feedback Mechanism |
Atomic Force Sensing |
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Optical, Topographic, Thermal, and ResistanceProfiling Resolution |
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Optical |
from 50 nm |
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Refractive Index Profiling |
from 50 nm, depending on sample |
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Refractive Index Resolution |
Approximately 10-5, depending on sample |
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Topographic |
from 100 nm |
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Thermal |
from 100 nm |
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Resistance |
from 100 nm |
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Sample Positioning
Rough |
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Scanner |
Inertial piezo motion with piezoelectric Flat Scanner (thickness 7 mm) |
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Range |
6 mm |
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Accuracy |
1 µm |
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Nanometric Scanning and Positioning |
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Scanner |
Piezoelectric Flat Scanner (thickness 7 mm) |
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Nanometric Scan Range |
70 - 140 µm (z), 70 - 140 µm (x-y) |
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Spatial resolution |
<1 nm (z), <5 nm (x-y) |
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Thermal & Resistance Imaging and Measurements |
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Temperature |
300°C or greater, depending on sample to be investigated |
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Thermal Sensitivity |
0.01°C
Measured Resistance Change per degree: 0.38 Ù/°C |
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Resistance Sensitivity |
0.001 Ù |
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Electronics and Software |
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Control System |
Nanonics/Topaz Controller.
Low noise control system for rough, fine scanning, and active feedback with nanometric resolution. |
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Software |
Quartz software for Nanonics/Topaz controller (Win 95/98 and NT).
Active feedback control software.
Real time image display, image acquisition (up to 8 channels) and analysis, 3D rendering, & ability to provide collages of multiple images.
Refractive index profiling deconvolution software integration of confocal channel with near-field/atomic force constraints |
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Phone: +972-2-6789573 |
Fax: +972-2-6480827 |
USA Toll Free (direct to sales): 1-800-289-7162 |
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