| Electrical Probes |
Gold-coated Nanonics glass AFM fiber tips can serve as excellent electrical probes for spreading resistance microscopy and AFM imaging, allowing electrical characteristics of a sample to be correlated with its surface topography.
The proximity of the surface being measured to the cantilever of regular AFM electrical probes is an important source of noise in the measurements. This noise can be significantly reduced by the cantilever height of Nanonics glass cantilevered probes. |
 |
|
Electrical Probe with a conductive gold coating
|
SEM of Electrical and STM Probe: line is 100 nm and gold-coated tip is 30 nm
|
|
Electrical Probe Specifications
|
|
Tip Diameter
|
>10 nm
|
|
Tip Length
|
30 µm - 500 µm (Cantilevered);30 µm - 1000 µm (Straight)
|
|
Cantilever Height
|
50 µm - 500 µm (Deep Trench probes available)
|
|
Cantilever Length
|
300 µm - 1000 µm
|
|
Force Constant
|
>1-20 N/m
|
|
Resonant Frequency
|
80-390 kHz
|
|
Conductive Coating
|
Au (thickness ~20nm)
|
|
|
|
 |
Phone: +972-2-6789573 |
Fax: +972-2-6480827 |
USA Toll Free (direct to sales): 1-800-289-7162 |
|
|
|
