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Semiconductors
Nanoindentation
Raman-AFM of MEMs Device
Stressed Silicon
Raman Imaging of Germanium Quantum Dots
MultiProbe NanoIndentation & AFM Profiling with On-line Raman
AFM with On-Line Raman of Strained Silicon
AFM, NSOM and Capacitance
NanoIndentation and Raman Characterization
Online AFM/Raman of an Si/SiO2 Grid
AFM/Raman of Si/SiO2 Grid
FIB Etched Trench
Resistance Imaging of PN Junction
Nanoindentation on Silicon
Thermal imaging of SRAM
TFT in Liquid Crystal Display
Silicon Semiconductor
Thermal Imaging of V Grooved Quantum Laser
Topography of SRAM
Reflection NSOM of SRAM
Topography of SRAM
Electrical Imaging of SRAM

SRAM after Chemical Mechanical Polishing
 
12x12 micron AFM image: No structure is visible as CMP leaves the topography very flat Reflection NSOM of the same region:
NSOM is able to reveal clear structures due to differences in the refractive index
 

All these images were produced using the The MultiView 1000™
Image produced by Electrical Resistance Imaging



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