This example demonstrates the use of the electrical features of the Nanonics glass probe based SPM sensors. The surface is flat and thus, there are no surface features that could indicate via the AFM topography where the pn junction is located but the resistivity image shows the resistance in two of the connected pn junctions. This data can be analyzed to give the carrier concentration. Only Nanonics can produce simultaneous Near-field optical and Electrical imaging These Images were produced using the The MultiView 1000™.
The Nanonics MultiView 1000™ is designed around the 3D Flatscan™ which has a completely free optical axis from above and below the sample. Nanonics uses NSOM cantilevered optical fiber probes which do not block the microscope objective. The metal coating of these probes allows them to be used for electrical measurementes while the aperture at their tips illuminates the sample in the near field.
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