All Nanonics systems show the ultimate of AFM imaging capability with the imaging of atomic steps in highly oriented pyrolytic graphite even on a dual microscope or on a microRaman.

AFM topographic image of 2x2 micron scan area shows atomic layer of Highly Ordered Pyrolytic Graphite [HOPG]. Height line profile (right) shows the different atomic layers at the marked line (left). The marked step at the graph shows a single atomic step of 3.75 Angstrom. Nanonics Systems allow for ultrahigh sensitive topographic imaging with minimal Z noise and single atomic layer imaging is a standard for all our systems.

WSxM software has been used for image processing of the pictures above: I. Horcas et al. Rev. Sci. Instrum. 78, 013705 (2007)