High Resolution NSOM Imaging in Reflection mode

A) Topographic AFM image of a Photonics Band Gap (PBG) structure, imaged with a 150nm AFM/NSOM cantilevered probe.

B) Online correlated NSOM image of the PBG structure at (A). Imaged with the same probe in reflection mode at a 532nm laser wavelength.

C) NSOM line profile shows a lateral resolution of 100nm in reflection mode.

Nanonics unique, spatially friendly glass based probes allow for free optical axis from the top for NSOM imaging in reflection mode. Unlike other NSOM techniques, the Nanonics approach exclusively integrates all MultiView SPM series with all types of optical microscopy including upright reflection microscopes, without obscuring the optical axis from above.
AFM and NSOM images are simultaneity acquired with the same probe to obtain fully correlated topographic and NSOM data without any need to change the probe.
For both feedback mechanisms of beam bounce and tuning fork, AFM/NSOM imaging is performed in normal force mode for the ultimate in sensitivity.
Nanonics' unique reflection NSOM mode is the standard for imaging opaque samples of photonic Si structures and microelectronics. All are easily characterized in reflection mode of an upright microscope without the need for complicated geometries.
As demonstrated above, Nanonics provides the ultimate NSOM resolution in reflection mode of less than 100nm.

Ideal systems for this application: