Super User

Super User

Wednesday, 23 March 2016 13:56

Nanolithography

Wednesday, 23 March 2016 13:55

AFM Images

Wednesday, 23 March 2016 13:55

Materials

Wednesday, 23 March 2016 13:54

Multiprobe SPM

Wednesday, 23 March 2016 13:53

Photonics and Plasmonics

Wednesday, 23 March 2016 13:52

AFM RAMAN

Wednesday, 23 March 2016 13:51

NSOM

Unique Protocols for the Highest Optical Resolution

Nanonics MultiView SPM systems are designed for the ultimate in AFM/NSOM performance and for seamless integration with online techniques such as optical microscopes, confocal, Raman etc. Such performance and integration is obtained due to a complex of SPM technology innovations of scanning stages, ultimate in AFM feedback and optically transparent probes pioneered by Nanonics. Such innovations allow for complete integration of the SPM head with conventional optical microscopes including upright, inverted and dual optical microscope configurations. The free optical axis from above and below the sample allows for performing all near-field and far-field modes of transmission, reflection, collection and fluorescence. In addition, unique apertureless NSOM (ANSOM) protocols are provided with specialized probes and specialized multiprobe SPM geometries.

Nanonics MultiView systems incorporate the following unique features which have led to numerous new understandings in the area of NSOM, Optical Resolution, nanophotonics and plasmonics. In the last two decades, hundreds of research papers have been published using Nanonics Muliview systems.

Tuesday, 08 March 2016 14:03

Scanning Polariton Interferometry

By combining the best of both worlds that photons and electrons have to offer, polaritons hold much promise for a variety of applications in optoelectronics and nanophotonics such as miniatiruzed circuits for improved information or energy transfer. Polaritons are hybrid or quasi particles that are made up of photons strongly coupled to an electric dipole. There are different kinds of polaritons such an electron-hole pair that form an exciton polariton, which is present in semiconductors, or electrons at a metal surface that create surface plasmon polaritons (SPPs). Exciton polaritons that are stable at ambient conditions are an active area of research interest. A particular group of semiconductor chalcogenide materials was recently identified to have the existence of polaritons under ambient conditions. However, these materials were previously investigated using far-field methods. These materials are important for their potential applications in information technology, bio-sensing and metamaterials.

In this work, a team of researchers led by Prof. Xu of University of Washington use a Nanonics MV 4000 operating in reflection NSOM to study waveguide polaritons in thin <300nm flakes of WSe2 at ambient conditions. Using this setup, they could directly excite and probe polariton modes by imaging their interference fringes in a method termed “scanning polariton interferometry” at different wavelengths to map out the entire polariton dispersion both above and below the excitation energy. In this study, the polaritons were observed to have a wavelength down to 300nm in WSe2 and propagate many microns below the excitation energy. The near-field illumination allowed for the first time direct excitation and real imaging of the exciton polariton without the need for complicated cavity fabrication. Furthermore, by tuning the excitation laser energy it was possible to map the entire polarity dispersion.

 


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To learn more about any Nanonics Systems feel free to contact us and speak to one of our experts.

 

Nanonics congratulates Y. Chen and Professors Olog Holtz, Jens Birch and Fredrik Karlsson of Linkoping University in Sweden on their recently published paper  "Determination of critical diameters for intrinsic carrier diffusion length of GaN nanorods with cryo-scanning near field- optical microscopy(Scientific Reports, 6, p. 21482).    These researchers used a Nanonics CryoView to measure GaN nanorods  with diameters of 50-800nm.   Using a 50nm apertured fiber probe and reflection NSOM operating at 10K, the authors mapped the photoluminescence to measure the carrier diffusion, as seen below in the photoluminescence image overlaid onto the topography of these nanostructures.

 

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