Etching of Chrome Film with Free Chlorine Radical 
 

4.5 X 4.5 micron image of Chorine line etched onto chrome film

Protein printing is made possible by the Nanonics Chemical Delivery System and Nanopipette

Only Nanonics can deliver chemicals or gas onto the sample on line, with no need to remove the tip from the sample.

Nanofountain Pen reviewed by Nature Materials In the August 2003 edition of Nature Materials. The Nanofountain Pen was reviewed in the Material Update section.

AFM height image of semiconductor chip	high resolution thermo-conductivity imaging the semiconductor chip.

AFM Thermo Resistive Nanonics Probe

 In the Dual Wire Thermo-Resistance probe, two platinum wires are stretched through the nanopipette and fused together at their tips. This fused junction has a resistance that is temperature-dependent. This unique tip allows simultaneous measurement of surface topography and thermal conductivity

Scanning Thermal Microscopy (SThM) for quantitatively investigating the heat dissipation characteristics in substrate-supported andsuspended (with asymmetric type of contacts) current-carrying GaN nanowires with diameters of4060 nm, where the phonon confinement is expected to play an important role in thermal transport. (a) Schematics of the SThM experiments; (b) ac and (c) dc SThM images with the inset to (b) showing the measured Vth (solid circles) as a function of Vrms and the parabolic fitting (dashed line); (d) SThM images showing the "double-line"-like structure and (e) the corresponding profile across the nanowire; (f) SThM image obtained in vacuum (106 Torr); (g) profiles of ambient and vacuum SThM images taken perpendicular to the nanowire. SOUDI ET AL., ACS NANO VOL. 5, NO. 1 (2011)

AFM Thermo Resistive Nanonics Probe

 In the Dual Wire Thermo-Resistance probe, two platinum wires are stretched through the nanopipette and fused together at their tips. This fused junction has a resistance that is temperature-dependent. This unique tip allows simultaneous measurement of surface topography and thermal conductivity

Only the MultiView 4000TM utilizing Dual Wire Thermo-Resistance probes with their exposed probe tip is capable of these functions.A thermal conductivity image (Lower Left) of a static random access memory (SRAM) device is compared with the AFM topography (Upper Left) , Electrical (Upper Right) and NSOM Imaging (Lower right).

Performed with Nanonics unique ultrastable Nano-wire glass insulated electrical probe.

• Ultrastable solid wire electrical probes q Ultra-Sensitive Tuning Fork Normal Force feedback
• Geometrical friendly for online multiprobe all under active AFM feedback.
• Low contact resistance and full insulation with glass upto the probe tip for high electro-potential resolution
• Glass coating insulation can be overcoated with metal to emulate coax geometries for ultrahigh sensitivity electrical imaging
• High cantilever design that minimizes cantilever electrical interference

 AFM Thermoresistive Nanonics Probe

In the Dual Wire Thermo-Resistance probe, two platinum wires are stretched through the nanopipette and fused together at their tips. This fused junction has a resistance that is temperature-dependent. This unique tip allows simultaneous measurement of surface topography and thermal conductivity

AFM/KPM imaging of graphene/Si. The Graphene is connected with a gold electrode biased with 1.5v.

AFM Height image shows the graphene structure (upper right corner).	Contact Potential Difference of the Graphene/Si interface.

	Height Prfile
	CPD

Performed with Nanonics unique ultrastable Nano-wire glass insulated electrical probe.

• Ultrastable solid wire electrical probes q Ultra-Sensitive Tuning Fork Normal Force feedback
• Geometrical friendly for online multiprobe all under active AFM feedback.
• Low contact resistance and full insulation with glass upto the probe tip for high electro-potential resolution
• Glass coating insulation can be overcoated with metal to emulate coax geometries for ultrahigh sensitivity electrical imaging
• High cantilever design that minimizes cantilever electrical interference

AFM Height image of FIB etched gold on Chromium sample  and line profile respectively (below)	Kelvin Probe image shows contact potential difference of Au/Cr structure.

Height	KPM

	Height Profile
	CPD Profile

Performed with Nanonics unique ultrastable Nano-wire glass insulated electrical probe.

• Ultrastable solid wire electrical probes q Ultra-Sensitive Tuning Fork Normal Force feedback
• Geometrical friendly for online multiprobe all under active AFM feedback.
• Low contact resistance and full insulation with glass upto the probe tip for high electro-potential resolution
• Glass coating insulation can be overcoated with metal to emulate coax geometries for ultrahigh sensitivity electrical imaging
• High cantilever design that minimizes cantilever electrical interference