---AFM-Raman---

AFM & Raman

Atomic Force Microscopy (AFM) provides a variety of nanometric characterizations such as topography, conductivity, and thermal measurements. While very effective at measuring certain properties, AFM can not identify the chemical composition of a given material. Raman spectroscopy, however, has emerged as a critical technique in the field of chemical characterization, accurately identifying and classifying materials in a number of diverse fields and industries such as: material science, chemistry, biophysics, semiconductors, and many more.

Combining AFM with Raman

Harnessing the power of these two techniques enables a synergistic and holistic analysis of a given material. As early as 2001, Nanonics Imaging exhibited the foresight to combine the advantages of AFM and Raman by providing an integrated platform. The joint AFM-Raman system allows for the strength and versatility of all modes of AFM (including mechanical, thermal, SECM, and electrical) combined with the chemical characterization of Raman. Nearly two decades later, Nanonics Imaging continues to be at the vanguard of integrated optical AFM-Raman systems, providing solutions in the most challenging areas of research and in the most innovative fields in applied sciences:

• Graphene and 2D materials
• Carbon Nanotubes
• Semiconductor metrology
• Biological samples

Proven Nanonics Results Across the Spectrum

1. Multi-Probe CAFM Raman

Multiprobe conductive AFM characterization with on-line monitoring of current and the 2D Raman scattering band of Graphene.

2. CAFM Raman

Conductive AFM imaging with on-line mnotioring of the Raman scattering G band of conducting SW CNTs.

3. SThM Raman

Scanning thermal conductivity image (SThM of GaN nanowire with on-line Raman in vacuum environemnt (ACS Nano Vol. 5 No.1, 2011)

4. AFM Raman

AFM-Raman imaging of semiconductor device.

• AFM AFM
• Raman1 Raman1
• Raman2 Raman2
•  

5. BioAFM Raman

AFM-Raman collage of lignin distribution on wood cell walls.

6. SECM Raman

SECM with on-line Raman monitoring of Cu etching.

7. Nanolithography Raman

Fountain pen nanolithography demonstrating controlled deposition of single wall CNTs with Raman determination of the CNT alignment (Nano Lett. 2016, 16, 1517-1522).

---Key Features---

The SpectraView is designed to generate exceptional results from both the AFM and the on-line Raman. Featuring VISTA (Vivid Imaging Soft Touch AFM), the system enables AFM imaging with the highest resolution. The SpectraView is the only AFM designed for natural Raman integration, not requiring any modification to the Raman optical path.

Nanonics AFM-Raman system enables integration of water immersion objective from above for high Raman collection efficiency in liquid with on-line AFM.

Unobstructed image from above of sample and probe in liquid environment, highlighting Nanonics natural top-down integrations. The Nanonics system employs glass cantilevered AFM and TERS probes, providing for complete optical integration.

Best Optical Integration

True optical compatibility:

• Operate with high NA objectives
• Integrate with water and oil immersion objectives

All optical configurations available in one configuration:

• True upright integration
• Side
• Inverted

AFM Designed for Advanced Raman Integration

• Tuning fork feedback without any optical interference with Raman laser
• Advanced SPM measurements with on-line Raman
• Ultra large Z range
• Manipulation and lithography with online Raman
• TERS operation in a wide variety of applications
• VISTA for AFM imaging of the most challenging samples in air and liquid
  

 Most Versatile System

• Scanning options: tip and sample scanning in one scanning head
• Optical integration options: Sit on microscope, separate, upright, inverted, side, or dual
• Large sample stage (optional)
• Compatible in a range of environmental conditions: Vacuum, Liquid, Low temperature, SECM