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| Double-Wire Thermoresistive Probes |
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Nanonics is the only supplier of thermoresistive (thermoconductivity) probes that provide intermittent contact imaging of surfaces. These probes are the first to provide thermal conductivity or resistance measurements alongside standard non-contact or intermittent contact normal force AFM. These probes can also be used as nanoheaters or active nanoIR NSOM sources.
Images of the same 14.5x14.5µm region of SRAM:
left: AFM image showing a flat topography with no features.
center: thermal conductivity image showing key features
right: resistance image of the same region showing the same features.
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Image of a Dual-Wire Thermoresistive
Probe with standard AFM characteristics
for non contact imaging
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Thermal image of a soft polymer surface
obtained using intermittent contact AFM |
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Double-Wire Thermoresistive Probe Specifications
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Sensitive Tip Size
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0.1 - 4 µm
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Minimum Sensing Area
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100 nm
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Resistance
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20 - 150 ohms
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Thermal Response Time
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> 20 µs
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Temperature Sensitivity
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< 10 millidegrees
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Temperature Coefficient of Resistance
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3.8 milliohms / ohm°C
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Operating Range
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< 700°C
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Probe Characteristics
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Pipette Material
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Borosilicate glass
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Shank Diameter
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1.0-1.5 mm
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Taper Length
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3 - 5 mm
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Total Length
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10mm- 5 cm
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Wire Material
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Pt
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Starting Wire Diameter
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25 or 50 µm
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Length of Wires Outside Glass
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2- 10 µm
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Cantilever Characteristics
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Tip Length
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30 µm - 500 µm (Cantilevered);30 µm - 1000 µm (Straight)
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Cantilever Height
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50 - 500 µm (Deep Trench probes available)
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Cantilever Length
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300- 1000 µm
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Force Constant
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> 5-20 N/m
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Resonant Frequency
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20 - 150 kHz
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Phone: +972-2-6789573 |
Fax: +972-2-6480827 |
USA Toll Free (direct to sales): 1-800-289-7162 |
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