Reflection Mode NSOM


Reflection Mode1

Reflection NSOM offers the ability to get high resolution imaging from opaque samples. To do effective reflection NSOM, a clear separation between the excitation path and the collection path is needed. Nanonics cantilevered NSOM probes easily provide for such a separation (picture) and allow for the easy reflection mode imaging. Straight NSOM probes or apertured Si probes use the same path for illumination and collection making such measurements nearly impossible. Reflection mode NSOM is ideal for mapping the optical properties of grain boundaries on Graphene and other 2D materials. Also Plasmonics and Photonic devices are often characterized in reflection mode NSOM.

AFM and NSOM images are simultaneity acquired with the same probe to obtain fully correlated topographic and NSOM data without any need to change the probe.

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