Raman Imaging of Diamond
Under AFM Control
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| A 2D Raman Intensity Image at 1333cm-1 with AFM Z control |
| 3-D Collage AFM Topography at 1525 cm-1 |
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3-D Collage AFM Topography at 1334 cm-1 |
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| 3D collages of the same area taken at two different wavelengths. The differences in the Raman spectrum are clearly visible. |
Note the differences in the intensity of the two images. For example the bright spots at the top of the image at 1334cm-1 which are absent from the image at 1525cm-1. No other Raman system has sufficient control of Z position to pick out these differences.
Only Nanonics combined Raman and AFM system can provide the z displacement necessary to pick out the features visible in the topography/Raman collages above.
For this measurement the cantilevered glass AFM probe was brought into contact with the sample using the MultiView 400™ SPM system.
The Nanonics MultiView 400™ system can be directly integrated into the Renishaw RM Series Raman Microscope. These microscopes employ the upright microscope configuration, and the Nanonics MultiView 400™ has a free optical axis which allows it to be readily placed on the sample stage of such a microscope (see picture).
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The Nanonics patented cantilevered optical fibers are held between the microscope lens and the sample without obstructing any aspect of the far-field optics. The tip in these fibers is exposed and is illuminated by the lens of the microscope, allowing the user to view the exact region where the SPM and Raman information is being collected.
Only Nanonics combined Raman and AFM system allows Raman spectra to be taken while an AFM tip is in contact with the sample.
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