| Deep Trench Probes |
Nanonics uses a patented unique technology to create cantilevered fiber probes that enables Deep Trench imaging. For example, a cantilevered AFM tip can be specially designed to probe inside a trench that is 1.5 mm deep and only 100µm wide.
In addition, Nanonics probes for other types of imaging, such as NSOM and electrical/thermal, can be designed as deep trench probes, giving these imaging modalities access to a wide range of surface topographies. |
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Deep trench Probe lying across 150µm lines
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Tips with high aspect ratios can easily be manufactured using glass pulling techniques. AFM tips (including Deep Trench Probes) with aspect ratios up to 10:1 are available. These probes have tip angles of 6°.
| Deep Trench Probe Specifications |
| Tip Diameter |
>10 nm |
| Tip Length |
30 µm - 500 µm |
| Cantilever Height |
500 µm - 1500 µm |
| Cantilever Length |
300 µm - 1000 µm |
| Force Constant |
from below 1N/m to 20 N/m |
| Resonant Frequency |
>390 kHz |
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Phone: +972-2-6789573 |
Fax: +972-2-6480827 |
USA Toll Free (direct to sales): 1-800-289-7162 |
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