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Electrical and Thermal SPM
Graphene Transistor AFM_EFM Imaging
Thermo Conductivity Imaging of Semiconductor Chip
Scanning Thermal Microscopy of GaN NanoWires
Scanning Photocurrent in Graphene Transistors
Nano Optical and Thermal SPM
MultiProbe AFM_Thermal_Electrical and NSOM Imaging
Kelvin Probe Imaging of Graphene
Kelvin Probe Imaging of Gold Silicon
KPM Imaging of Gold Electrode on Doped Silicon
Kelvin Probe Imaging of Au/Cr
Schottky Diode I-V Characterization
Spreading Resistance Electrical Imaging of Au_Si
Au etched groove on silicon
Thermo Resistance Imaging of Chip
Current Mapping of Au Electrodes on Silicon

afm_423   electrical_423
 AFM height Image of gold electrodes on Silicon substrate  Current mapping correlated image performed with MV4000 tuning fork feedback shows conductivity distribution of the sample shown below.

sample_396  sample description 
   

 

Performed with Nanonics unique ultrastable Nano-wire glass insulated electrical probe.

electrical_probe_600_02

  • Ultrastable solid wire electrical probes q Ultra-Sensitive Tuning Fork  Normal Force feedback
  • Geometrical friendly for online multiprobe all under active AFM feedback.
  • Low contact resistance and full insulation with glass upto the probe tip for high electro-potential resolution
  • Glass coating insulation can be overcoated with metal to emulate coax geometries for ultrahigh sensitivity electrical imaging
  • High cantilever design that minimizes cantilever electrical interference
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