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| CryoView 2000™ |

The Nanonics CryoView 2000TM introduces the world of integrated microscopy to low temperature research. With simultaneous NSOM, AFM, Confocal and Raman imaging, complementary techniques can be used to analyze samples at low temperatures and high vacuums.
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Key Features Design Online Integrations Specifications |
- The First Low Temperature System with optical access from above and below the sample
- Simultaneous AFM and NSOM at Temperatures down to 10K
- Large scan range 50um in the XY plane and Z-scanning over 25um
- Online Probe and Sample-scanning
- 5x10-8 Torr High Vacuum Chamber
- Unit mounted on standard upright, inverted or dual microscope. Easily interchange standard optics from the deep UV to the IR
- Simple hard connection to commercial confocal Raman and ultrasensitive emission systems. No high loss fiber to spectrometer connections needed
- CryoView Integration Package: innovative mirror based solutions for CryoView interconnection with fsec & other noise producing lasers on the same optical table
- Rapid warming and easy replacement of sample and probe only available when immersion cryostats are not used
- Imaging with Nanosensors recently introduced silicon tuning fork probes.
Normal force sensing with high Q factors providing ultimate control of tip sample separation. Overcomes standard optical feedback problems in cryogenic systems
- NanoToolKitTM of Optically Friendly exposed probe tip SPM probes for AFM, NSOM, Coax Electrical, Thermal & NanoFountain PenTM Including unique AFM controlled Gas Deposition Nanopipette Probes at low temperature impossible in immersion cryostats
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Nanonics CryoView 2000TM breaks the barrier of integrating far-field optics with Cryo scanned probe & near-field microscopy. The following unique combination of features is responsible for the transparent integration with optics for bridging AFM, NSOM, Confocal and Raman imaging:
- The 3D FlatScanTM Scanner Technology
- Cantilevered Glass AFM/NSOM probes
- Breakthrough in Tuning Fork Feedback
CryoView 2000TM Chamber's Design
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CryoView 2000TM Top View
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Easy Access to Sample and Probe
The Cryoview 2000TM scanner port can be opened for easy access to both the sample and the probe without needing to open the entire vacuum chamber. Probes are supplied premounted on a probe holder which includes the tuning fork used for the feedback. Using this probe holder the probe can be easily replaced, accurately and repeatedly. The sample sits directly beneath the scanner port which is located for quick access.
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Scanner hinge allows you to easily open The CryoView and expose the probe scanner & sample which sits under the optical window.
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Motorized Sample Positioning
The CryoView 2000TM X-Y-Z motorized stage controls rough motion in the x, y and z directions with three independently operated stepper motors. This allows for rough motion of the sample in the x and y axis, for easy sample positioning. The motion in the z axis allows manual coarse approach and automatic fine approach of the probe to the surface. The unique design of the stage keeps the sample stage far from heat sources within the chamber and leaves the optical axis completely free.
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XYZ Sample Positioning System: The sample is mounted on a motorized XYZ-stage
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Large XYZ Scan Range
The CryoView 2000TM uses the 3D FlatScanTM technology developed by Nanonics. A novel planar, folded-piezo, flexure scan design allows simultaneous lateral and axial sample scanning. The ultra thin package and open optical axis permits the scanner to be incorporated into systems where conventional scan stages are too bulky and geometrically awkward. The CryoView 2000TM uses two 3D FlatScanTM scanners to provide 1nm resolution in the tip scanner and 0.02nm resolution in the sample scanner in the x, y and z directions. The minimal stage height of 7 mm allow for easy access with high powered microscope objectives from either above or below the scanning stage. The large vertical (axial) displacement of up to 70 microns simplifies approaching a sample and allows tracking of structures with very large topographical features. See below for a schematic cross section of the CryoView 2000TM Chamber.
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1. Cryogenic Tip Scanner
2. Upper sapphire window
3. Upper radiation screen
4. Copper wire braids
(heat changer)
5. Cryostat
6. Cold finger
7. Radiation shield
8. Bottom radiation screen
9. Bottom sapphire window 10. XYZ positioning
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10. XYZ positioner
11. Transmission
12. Stepper motor
13. UHV Chamber
14. UHV pump station
15. Vacuum seal
16. Removable chamber cover
17. Cryogenic sample scanner
18. Cold sample mount
19. Scanner hinge
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High Vacuum System
The CryoView 2000TM is designed around a central 5x10-8 Torr vacuum chamber. Each side of the octagonal chamber is equipped with a port to add flexibility to the system. When used for low temperature work, a vacuum pump station is connected to the chamber and evacuates the cryostat for operation at an interim temperature of <25 K. The chamber can be connected to a high vacuum pump station and a transfer line from a dewar that contains the cryogen for low-temperature operation at temperatures down to 10K.
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Ion pump system to maintain high vacuum without vibration (Left). Turbo pump system to reach high vacuum (Right)
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CryoView 2000TM parts
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Transparent optical axes of the CryoView 2000TM allows for flexible online integration for different applications.
Optical Microscopy
CryoView 2000TM with the 3D FlatScanTM scanning stage technology and cantilevered glass probes is the first cryo system with transparent optical access from above and below. Upright, Inverted and Dual optical microscope configurations are used for online viewing the probe and sample inside the cryogenic chamber during SPM operation.
CryoView 2000TM/Raman Integration
Simply Connect The CryoView To All Spectroscopies Even Conventional Raman
| Nanonics Integration Package & Renishaw Invia Raman Spectrometer: Isolating the SPM/NSOM From Surrounding Laser Vibrational Noise On The Same Table |
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Notice! No need for high loss fiber connections to monochromators
The Only Cryogenic SPM That Connects To All Manufacturers MicroRamans Via Standard Connections
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A standard microRaman connection provided by Horiba Jobin Yvon that connects to Nanonics CryoView Integration Package |
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CryoView 2000TM Integration Package
Nanonics innovative mirror based solutions for CryoView interconnection with fsec & other noise producing lasers on the same optical table.
The separation is at a point where infinity corrected lenses have parallel beams
Fsec lasers can now be placed on the same table. Thus they can be now integrated with standard mirrors without group velocity dispersion problems of long fibers
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CryoView 2000TM Integration Package
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CryoView 2000TM NSOM
All modes of NSOM without any geometric obstructions. Allowing for reflection, transmission & collection
Quantum dots AFM/NSOM imaging in Reflection mode with Cryoview 2000TM
NanoToolKitTM
Explore Nanonics NanoToolKitTM of Optically Friendly exposed probe tip SPM probes for AFM, NSOM, Coax Electrical, Thermal & NanoFountain PenTM Including unique AFM controlled Gas Deposition Nanopipette Probes at low temperature impossible in immersion cryostats
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| Parameter |
Specification |
| Near-field Optical Microscopy |
Transmission, reflection, collection, fluorescence |
| Atomic Force Microscopy |
Contact, non-contact, intermittent-contact |
| Feedback Mechanism |
Tuning Fork Feedback |
| Confocal Microscopy |
Transmission, reflection, fluorescence |
| Scanning/Sample |
| Scanner |
Piezoelectric flat scanner (thickness 7 mm). Scan Range:25µm Z-range, 50µm XY-range (30µm and 10µm on request) Maximum Load: 75 g |
| Step Size |
< 1 nm for 70 µm scanner; < 0.02 nm for 10 µm scanner |
| Sample Positioning |
XYZ stepper motors |
| Maximum Sample Size |
16 mm diameter, custom mounts for larger samples can be provided |
| Probes |
| NSOM-Probes |
Cantilevered tapered optical fiber probes |
| AFM-Probes |
Cantilevered tapered glass probes |
| Specialized Probes |
Cantilevered probes for electrical or thermal measurements.Custom probes available on request |
| Optics |
| Viewing/Detection Optics |
Free optical access to the sample from top and bottom for optical observation of the sample (all conventional far-field modes of operation are available) and for detection of the NSOM signals with any optical microscope (upright, inverted, dual) or other optics |
| Detectors |
Photomultiplier Tube (PMT), Avalanche Photodiode Detector (APD), InGaAs Detector for IR, CCD |
| Lasers |
A large variety of laser systems can be used (UV, VIS, IR) |
| Video System |
Optional CCD camera |
| Optical Resolution |
| Confocal Microscopy |
Diffraction limited |
| Near-field Microscopy |
From 50 nm upwards, depending on the aperture size of the NSOM probe used |
| Controller and Software |
| Controller |
NanonicsIntegra Controller(Digital Instruments Controllers can also be used) |
| Software |
Quartz Software forIntegraController (Win 95/98 and NT).Real time image display, image acquisition (up to 8 channels) and analysis, 3D rendering |
| Low Temperature |
| Temperature Range |
Room temperature to <10K |
| Ports |
Extra port for additional feedthroughs |
| High Vacuum |
5x10-8 Torr |
| Options |
| Electrical Measurements |
Options for resistance, thermal measurements |
| Nanochemical/Gas Delivery |
Deliver a chemical via the nanopipette-AFM tip to your sample surface |
| Raman Microscopy |
Full integration with Raman microscopes and through optical hard coupling of Nanonics Integration Package |
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Phone: +972-2-6789573 |
Fax: +972-2-6480827 |
USA Toll Free (direct to sales): 1-800-289-7162 |
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