Scanning Spreading Resistance and Electrical SPM Modes

 

 

 

 

 

 

 

AFM/EFM imaging of graphene transistor. Height AFM image (upper left) and correlated Electrostatic Force Microscopy imaging performed with Nanonics Pt nanowire electrical probe (Upper right Image). The graphene is connected to two separate gold electrodes (upper right and lower left corners) which have been biased with 1.5v Lower Left Image is 3D presentation of the AFM image . Lower Right Image is AFM/EFM 3D collage presentation

   
AFM 2D Closeup EFM 2D closeup
   
AFM 2D Closeup AFM/EFM Collage

 

 

Performed with Nanonics unique ultrastable Nano-wire glass insulated electrical probe.

 

  • Ultrastable solid wire electrical probes q Ultra-Sensitive Tuning Fork Normal Force feedback
  • Geometrical friendly for online multiprobe all under active AFM feedback.
  • Low contact resistance and full insulation with glass upto the probe tip for high electro-potential resolution
  • Glass coating insulation can be overcoated with metal to emulate coax geometries for ultrahigh sensitivity electrical imaging
  • High cantilever design that minimizes cantilever electrical interference