SRAM Topographic Image

 
SRAM
AFM, Thermal and Resistance Imaging
  
     
25x25 micron Thermal Image   AFM Image of the same region obtained in theIntermittent contact mode 
     

Only Nanonics Thermal Probes are capable of thermal imaging in the intermittent contact mode.
 
These images were obtained by the
MultiView 400™
 
 
Simultaneous Resistivity Image of the same region

Nanonics Thermal Probes have a thermal response time under 20us, thermal resolution under 10 millidegrees and nanometric spacial resolution.

In the Dual Wire Thermoresistive probe, two platinum wires are stretched through the nanopipette and fused together at their tips. This fused junction has a resistance that is temperature-dependent. This unique tip allows simultaneous measurement of surface topography with thermal conductivity or temperature.

  
 
SEM of Dual-Wire thermoresistive probe showing fused junction
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