Silicon Semiconductor image

 

Only Nanonics combined Raman and AFM system allows Raman spectra to be taken while an AFM tip is in contact with the sample.

     
9 x 7 micron AFM image   Raman intesityof the same region at 520nm/cm obtained  simultaneously

For this measurement the cantilevered glass AFM probe  was brought into contact with the sample using the MultiView 400™ SPM system.

The Nanonics MultiView 400™ system can be directly integrated into the Renishaw RM Series Raman Microscope. These microscopes employ the upright microscope configuration, and the Nanonics MultiView 400™ has a free optical axis which allows it to be readily placed on the sample stage of such a microscope (see picture). 

The Nanonics patented cantilevered optical fibers are held between the microscope lens and the sample without obstructing any aspect of the far-field optics. The tip in these fibers is exposed and is illuminated by the lens of the microscope, allowing the user to view the exact region where the SPM and Raman information is being collected.		  
 
The MultiView 400™ Integrated with a standard Raman Microscope

Only Nanonics combined Raman and AFM system allows Raman spectra to be taken while an AFM tip is in contact with the sample.

 
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