AFM topographic image of nanometric CdSe quantum dots dispersed on H2 treated gold substrate
- Quantum dots with dimensions of few nanometers are easily imaged with
Nanonics SPM MultiView series due to the sub-Angstrom accuracy of the XYZ 3D
FlatScanTM sample stage.
- The ultra-sensitive phase feedback of the Nanonics Integra Controller with its
large dynamic range and its low Z noise provide a clear image of nanometric
features inspite of a relatively large topographic background.
Ideal systems for this application: