Piezo Force Microscopy

Piezo Force Imaging of Periodically Poled Potassium Titanyl Phosphate PPKTP, using a Doped Diamond Si conductive probe in the contact mode. Contact resonance PFM has been used for imaging of Topographic, Phase and Amplitudes signals.

Height Phase Amplitude

Same images in 3D:

Height Phase Amplitude

 

PFM Collage With Topography:

       
Height-Phase Height-Amplitude