Only the MultiView 4000TM utilizing Dual Wire Thermo-Resistance probes with their exposed probe tip is capable of these functions.A thermal conductivity image (Lower Left) of a static random access memory (SRAM) device is compared with the AFM topography (Upper Left) , Electrical (Upper Right) and NSOM Imaging (Lower right). |
Performed with Nanonics unique ultrastable Nano-wire glass insulated electrical probe.
- Ultrastable solid wire electrical probes q Ultra-Sensitive Tuning Fork Normal Force feedback
- Geometrical friendly for online multiprobe all under active AFM feedback.
- Low contact resistance and full insulation with glass upto the probe tip for high electro-potential resolution
- Glass coating insulation can be overcoated with metal to emulate coax geometries for ultrahigh sensitivity electrical imaging
- High cantilever design that minimizes cantilever electrical interference
AFM Thermoresistive Nanonics Probe
In the Dual Wire Thermo-Resistance probe, two platinum wires are stretched through the nanopipette and fused together at their tips. This fused junction has a resistance that is temperature-dependent. This unique tip allows simultaneous measurement of surface topography and thermal conductivity