NANONICS IMAGING HEADQUARTERS

Sales and Marketing

Nanonics Imaging is represented by an extensive global network of representatives. Scroll down to locate your local distributor information; distributors are organized by continent and country.  You are also always welcome to contact our headquarters directly for all your needs at the contact information listed direclty below:

To contact your local sales representative locate your region below:

North America

South America

Australia

Europe

Asia

Click here if you do not find the country you are looking for

North America

South America

	Brazil
	Company:		Insight Tecnica
	Contact:		Michael Dean Buckley	Rua Artur Azevedo, 2008 São Paulo -SP - Brasil CEP 05404-005
	Phone:		Brasil: +55 1130429127 US: +01 858 997 0768
	E-Mail:		info@insighttecnica.com
	Website:		http://www.insighttecnica.com/

	Chile
	Company:		AGSENS
	Contact:		Juan Aguilera
	Phone:		56226950836
	E-Mail:		info@agsens.com
	Website:		http://www.nanonics.co.il/contact-information/sales-contacts.html

http://www.nanonics.co.il/contact-information/sales-contacts.html

Australia

	Australia
	Company:		LASTEK PTY LTD
	Contact:		Anthony Quinn
	Phone:		+61 8 84438668
	E-Mail:		aquinn@lastek.com.au
	Website:		www.lastek.com.au

Europe

	Austria
	Company:		SOLITON
	Contact:		Toni Beckmann
	Phone:		08105 7792 0
	E-Mail:		t.beckmann@soliton-gmbh.de
	Website:		www.soliton-gmbh.de

	Cyprus
	Company:		A N E L I S  E.E.
	Contact:		Lefteris Klothakis
	Phone:		+30 210 7524444
	E-Mail:		eklot@anelis.gr
	Website:		www.anelis.gr

	Czech Republic
	Company:		SOLITON
	Contact:		Toni Beckmann
	Phone:		08105 7792 0
	E-Mail:		t.beckmann@soliton-gmbh.de
	Website:		www.soliton-gmbh.de.com

	Greece
	Company:		A N E L I S  E.E.
	Contact:		Lefteris Klothakis
	Phone:		+30 210 7524444
	E-Mail:		eklot@anelis.gr
	Website:		www.anelis.gr

	Germany
	Company:		SOLITON
	Contact:		Toni Beckmann
	Phone:		08105 7792 0
	E-Mail:		t.beckmann@soliton-gmbh.de
	Website:		www.soliton-gmbh.de

	Ireland
	Company:		SEMIMETRICS LTD.
	Contact:		Eric Don
	Phone:		0191 232 3950
	E-Mail:		eric.don@semimetrics.com
	Website:		www.semimetrics.com

	Lithuania
	Company:	UAB "EXPERTUS VILNENSIS"
	Contact:	Arvidas Neniskis
	Phone:	+370 5 2729374 Mobile: +370 687 41630
	E-Mail:	arvidas@exvil.lt
	Website:	www.exvil.lt

	Netherlands
	Company:		K-ANALYS AB
	Contact:		Lars Halldahl
	Phone:		+ 46 18 590 575
	E-Mail:		lars.halldahl@kagaku.se
	Website:		www.k-analys.se

	Poland
	Company:		SOLITON
	Contact:		Toni Beckmann
	Phone:		08105 7792 0
	E-Mail:		t.beckmann@soliton-gmbh.de
	Website:		www.soliton-gmbh.de

	Romania
	Company:		RONEXPRIM S.R.L
	Contact:		Mihai Balas
	Phone:		+40(21)314 35 99; +40(21)314 35 98 Mobile: +40 722 662 752
	E-Mail:		mb@ronexprim.com
	Website:		www.ronexprim.com

	Spain
	Company:		SCIENTEC
	Contact:		Javier Ledesma
	Phone:		+34610453275
	E-Mail:		jledesma@scientec.es
	Website:		www.scientec.es

	Switzerland
	Company:		DYNEOS AG
	Contact:		Stephen Zurcher
	Phone:		+41-52-355-12 40
	E-Mail:		info@dyneos.ch
	Website:		www.dyneos.ch

	UK
	Company:		SEMIMETRICS LTD.
	Contact:		Eric Don
	Phone:		0191 232 3950
	E-Mail:		eric.don@semimetrics.com
	Website:		www.semimetrics.com

Asia

	China
	Company:		K-ANALYS TRADING (SHANGHAI)
	Contact:		Yanlin Xu		Vicky Yuan
	Phone:		+86 13816461476		+86 21 5836 2582
	E-Mail:		yanlin.xu@k-analys.se		vicky.yuan@k-analys.se
	Website:		www.k-analys.se

	Hong Kong
	Company:		GUY LEUNG GUYLINE
	Contact:		Wendy Lai
	Phone:		+852 2856 0606
	E-Mail:		wendy@guyline.com.hk
	Website:		www.guyline.com.hk

	India
	Company:		LABINDIA INSTRUMENTS PVT. LTD.
	Contact:		Samik Pal		Hemant Borgaonkar
	Phone:		+852-2856-0606		+91 22 25986062
	E-Mail:		samikp@labindia.com		borgaonkarhv@labindia.com
	Website:		www.labindia.com

	Japan
	Company:		TOMOE ENGINEERING
	Contact:		Akifumi Kobayashi
	Phone:		+81 3 5435 6516
	E-Mail:		akobayashi@tomo-e.co.jp
	Website:		http://www.tomo-e.co.jp/index_e.html

	Korea
	Company:		CnH Tech
	Contact:		Chulsu Kim
	Phone:		+82 2 6352 9920
	E-Mail:		cskim@cnhtech.co.kr
	Website:		www.cnhtech.co.kr

	Malaysia
	Company:		ALPHA INSTRUMENTS		EMANUEL SDN BHD
	Contact:		Fuad Rahman		Chai Kok
	Phone:		HP: +6012-6246438		+60389435090
	E-Mail:		a.fuadrahman@alphaiss.com.my		chaikok1234@yahoo.com
	Website:		www.alphaiss.com.my/		http://www.alphaiss.com.my

	Singapore
	Company:		EINST TECHNOLOGY PTE LTD
	Contact:		Weelee Tok
	Phone:		+65 9656 8953
	E-Mail:		weelee@einstinc.com
	Website:		www.einstinc.com/

	Taiwan
	Company:		PROTRUSTECH CO. LTD
	Contact:		Dr. Bluse Chen
	Phone:		Taiwan Office: +886 6 2892081 Taipei Office: +886 2 29995339
	E-Mail:		service@protrustech.com
	Website:		www.protrustech.com/

Middle East

	Israel
	Company:		NANONICS IMAGING LTD. HEADQUARTERS
	Contact:		Sales & marketing
	Phone:		+972 2 678 9573
	E-Mail:		info@nanonics.co.il
	Website:		http://www.nanonics.co.il/

Rest of the world

For contact information on Nanonics head office and US office

AFM Integration with Scanning Electro Chemical Microscopy

Topographic and Phase Measurements 

Scan range: 1x1microns

Measurements were done using Nanonics AFM probe with tip diameter 10 nm and SPM MV-400 Resonance Frequency of Probe 50 KHz on a Renishaw Raman MicroSpectrometer.

The sensitivity of the phase image is shown by the differential imaging of different chemical constitution (see contrast of red and green arrow relative to blue arrow indicating the background. Such an effect is only seen in the phase image but not the topography image.

Line Scan of the Topographic Image  

Line Scan of the Phase Image

Topographic and Phase Measurements

Measurements were done using Nanonics AFM probe with tip diameter 10 nm and SPM MV-400. Same probe was used as in the first set of measurements, but at a different place on the sample.

Line Scan of the Topographic Image

Line Scan of the Phase Image

Topographic and Phase Measurements

Measurements were done using Nanonics AFM probe with tip diameter 10 nm and SPM MV-2000 Resonance Frequency of Probe 36 KHz on a Renishaw Raman MicroSpectrometer.

Topographic and Phase Measurements

Measurements were done using Si probe with tip diameter 10 nm on an SPM MV-400 Resonance Frequency of Probe 145 KHz on a Renishaw Raman MicroSpectrometer.

Topographic and Phase Measurements

Measurements were done using Si probe with tip diameter 10 nm on an SPM MV-400
Same probe was used as in the previous set of measurements, but at a different place on the sample.

GProtein Lines

2.5X2.5 micron AFM of Printed G Protein		AFM of Printed GFP
		Only Nanonics can deliver chemicals or gas onto a sample on line, with no need to remove the tip from the sample.
25 X 20 micron NSOM image of printed GFP

A movie of online protein printing is shown on the left.

Nanofountain Pen reviewed by Nature Materials In the August 2003 edition of Nature Materials. The Nanofountain Pen was reviewed in the Material Update section. Click to download application note on the uses of the nanofountain pen (331kB)

AFM/NSOM Imaging of Fibroblast Cells in Liquid Cell

(A) AFM  topographic imaging with simultaneous NSOM imaging (B) with an AFM/NSOM cantilevered fiber probe at transmission mode (50x objective    of an inverted optical microscope) in liquid cell	AFM of similar fibroblast cells with an AFM nominally designed for BioAFM

Topography (Left) and NSOM Images (Right). Scan Range 50x50 Microns 

Unparalleled Scanned Probe Cellular Imaging 
Fully Integrated with Optical Microscopy

CCD image of the sample with SPM/NSOM probe at the cell surface. The point of SPM imaging can be seen clearly in the optical microscope.

These images illustrate the ability of Nanonics' MultiView systems to overcome the difficulties usually associated with viewing live, soft tissue liquid samples. Nanonics' SPM systems allow facile viewing of liquid samples via a versatile and user-friendly liquid cell attachment. The open architecture of Nanonics' SPM heads allows the user to view samples from above and below. These systems are easily integrated into Nanonics' dual microscope which combines both upright and inverted formats. This is particularly important for better resolution of low-contrast biological samples.

The free optical axes also allows fluorescence and Raman imaging to be achieved with ease.

With the same system AFM was employed for topographical mapping. The AFM was completed in intermittent contact mode, as regular contact mode would have scratched the soft tissue. Nanonics' systems are able to operate in all three SPM modes.

SNOM (Scanning Near-Field Optical Microscopy) is an alternative name for NSOM (Near-Field Scanning Optical Microscopy).

The basic principle of SNOM near-field optics: Light passes through a sub-wavelength diameter aperture and illuminates a sample that is placed within its near field, at a distance much less than the wavelength of the light. The resolution achieved is far better than that which conventional optical microscopes can attain.

Nanonics Imaging Ltd. is the world leader in the production of SNOM systems.

Some Nanonics SNOM systems include:

The MultiView 1000™- Sample-scanning SNOM Microscope.

The MultiView 2000™- The first ever combined tip- and sample-scanning SNOM system.

The MultiView 4000™- The most advanced Nanonics Multiview system.

CryoView MP™- The first commercial Low-Temperature SNOM system with free optical access.