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Thermo Resistance Imaging of Chip

   
 AFM  Thermo-resistance
   
 AFM  Thermo-Resistance
AFM height image of semiconductor chip  high resolution thermo-conductivity imaging the semiconductor chip. 

 

AFM Thermo Resistive Nanonics Probe

 

 In the Dual Wire Thermo-Resistance probe, two platinum wires are stretched through the nanopipette and fused together at their tips. This fused junction has a resistance that is temperature-dependent. This unique tip allows simultaneous measurement of surface topography and thermal conductivity

 
Scanning Thermal Microscopy (SThM) for quantitatively investigating the heat dissipation characteristics in substrate-supported andsuspended (with asymmetric type of contacts) current-carrying GaN nanowires with diameters of4060 nm, where the phonon confinement is expected to play an important role in thermal transport.

(a) Schematics of the SThM experiments; (b) ac and (c) dc SThM images with the inset to (b) showing the measured Vth (solid circles) as a function of Vrms and the parabolic fitting (dashed line); (d) SThM images showing the "double-line"-like structure and (e) the corresponding profile across the nanowire; (f) SThM image obtained in vacuum (106 Torr); (g) profiles of ambient and vacuum SThM images taken perpendicular to the nanowire.

SOUDI ET AL., ACS NANO VOL. 5, NO. 1 (2011)

AFM Thermo Resistive Nanonics Probe

 

 In the Dual Wire Thermo-Resistance probe, two platinum wires are stretched through the nanopipette and fused together at their tips. This fused junction has a resistance that is temperature-dependent. This unique tip allows simultaneous measurement of surface topography and thermal conductivity

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Nano Optical and Thermal SPM

 
 
The MultiView 4000TM System simplifies the task of optically and thermally profiling on-line an optoelectronic device. Seen in these images (above) are the optical distribution of light in a quantum wire laser (NSOM) and the thermal distribution around the laser. The image below includes the p contact region in the thermal image. As can be seen, the thermal and light distribution bear no correlation to one another, but rather the thermal distribution is bowed towards the p contact where electrical charge is injected.

 

 

AFM Thermo Resistive Nanonics Probe

 

 In the Dual Wire Thermo-Resistance probe, two platinum wires are stretched through the nanopipette and fused together at their tips. This fused junction has a resistance that is temperature-dependent. This unique tip allows simultaneous measurement of surface topography and thermal conductivity

 

 
Only the MultiView 4000TM utilizing Dual Wire Thermo-Resistance probes with their exposed probe tip is capable of these functions.A thermal conductivity image (Lower Left) of a static random access memory (SRAM) device is compared with the AFM topography (Upper Left) , Electrical (Upper Right) and NSOM Imaging (Lower right).

Performed with Nanonics unique ultrastable Nano-wire glass insulated electrical probe.

 

  • Ultrastable solid wire electrical probes q Ultra-Sensitive Tuning Fork Normal Force feedback
  • Geometrical friendly for online multiprobe all under active AFM feedback.
  • Low contact resistance and full insulation with glass upto the probe tip for high electro-potential resolution
  • Glass coating insulation can be overcoated with metal to emulate coax geometries for ultrahigh sensitivity electrical imaging
  • High cantilever design that minimizes cantilever electrical interference

 

 AFM Thermoresistive Nanonics Probe

 

In the Dual Wire Thermo-Resistance probe, two platinum wires are stretched through the nanopipette and fused together at their tips. This fused junction has a resistance that is temperature-dependent. This unique tip allows simultaneous measurement of surface topography and thermal conductivity

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Kelvin Probe Imaging of Graphene

AFM/KPM imaging of graphene/Si. The Graphene is connected with a gold electrode biased with 1.5v.

AFM Height image shows the graphene structure (upper right corner).

Contact Potential Difference of the Graphene/Si interface. 

 

   Height Prfile
   CPD

Performed with Nanonics unique ultrastable Nano-wire glass insulated electrical probe.

 

  • Ultrastable solid wire electrical probes q Ultra-Sensitive Tuning Fork Normal Force feedback
  • Geometrical friendly for online multiprobe all under active AFM feedback.
  • Low contact resistance and full insulation with glass upto the probe tip for high electro-potential resolution
  • Glass coating insulation can be overcoated with metal to emulate coax geometries for ultrahigh sensitivity electrical imaging
  • High cantilever design that minimizes cantilever electrical interference
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Kelvin Probe Imaging of Gold Silicon

Gold/Silicon interface AFM Imaging Contact Potential Difference at the gold/silicon interface  
   
  Height Profile 
   CPD Profile
 
 Height AFM image of gold electrode on doped silicon surface   KPM image shows the Contact Potential Difference of gold electrode on doped silicon  

Performed with Nanonics unique ultrastable Nano-wire glass insulated electrical probe.

 

  • Ultrastable solid wire electrical probes q Ultra-Sensitive Tuning Fork Normal Force feedback
  • Geometrical friendly for online multiprobe all under active AFM feedback.
  • Low contact resistance and full insulation with glass upto the probe tip for high electro-potential resolution
  • Glass coating insulation can be overcoated with metal to emulate coax geometries for ultrahigh sensitivity electrical imaging
  • High cantilever design that minimizes cantilever electrical interference
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Kelvin Probe Imaging of Au/Cr

 

 

 

   
AFM Height image of FIB etched gold on Chromium sample  and line profile respectively (below)    Kelvin Probe image shows contact potential difference of Au/Cr structure.  

 

 

   
 Height  KPM

 

   Height Profile
   CPD Profile

Performed with Nanonics unique ultrastable Nano-wire glass insulated electrical probe.

 

  • Ultrastable solid wire electrical probes q Ultra-Sensitive Tuning Fork Normal Force feedback
  • Geometrical friendly for online multiprobe all under active AFM feedback.
  • Low contact resistance and full insulation with glass upto the probe tip for high electro-potential resolution
  • Glass coating insulation can be overcoated with metal to emulate coax geometries for ultrahigh sensitivity electrical imaging
  • High cantilever design that minimizes cantilever electrical interference
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Schottky Diode I-V Characterization

 
Localized Schottky Diode I-V characterization:  20nm gold layer on 5nm Ti over Silicon substrate (Natural Oxide)    High sensitivity AFM Pt nanowires probes are used with the Nanonics MultiProbe system for electrical nano-charactarization of the inspected sample. One probe is used as a voltage source and the second probe is used to measure the current. The ability of these probes to provide both electrical and topographical information creates a special platform of accurate alignment at nanometric features such as nanotubes, nanoparticles and other molecular devices.

The electrical measurements and analysis are fully controlled through the SPM system. Hence, a comprehensive analysis of I-V nanometric spectroscopy correlated with topographical maps are provides.

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