One System - All Configurations, All Modes of Operation

Spectra Resize2





AFM & Raman

Atomic Force Microscopy (AFM) provides a variety of nanometric characterizations such as topography, conductivity, and thermal measurements. While very effective at measuring certain properties, AFM can not identify the chemical composition of a given material. Raman spectroscopy, however, has emerged as a critical technique in the field of chemical characterization, accurately identifying and classifying materials in a number of diverse fields and industries such as: material science, chemistry, biophysics, semiconductors, and many more.

Combining AFM with Raman

Harnessing the power of these two techniques enables a synergistic and holistic analysis of a given material. As early as 2001, Nanonics Imaging exhibited the foresight to combine the advantages of AFM and Raman by providing an integrated platform. The joint AFM-Raman system allows for the strength and versatility of all modes of AFM (including mechanical, thermal, SECM, and electrical) combined with the chemical characterization of Raman. Nearly two decades later, Nanonics Imaging continues to be at the vanguard of integrated optical AFM-Raman systems, providing solutions in the most challenging areas of research and in the most innovative fields in applied sciences:

  • Graphene and 2D materials
  • Carbon Nanotubes
  • Semiconductor metrology
  • Biological samples

Proven Nanonics Results Across the Spectrum

1. Multi-Probe CAFM Raman

Multiprobe conductive AFM characterization with on-line monitoring of current and the 2D Raman scattering band of Graphene.

2. CAFM Raman

Conductive AFM imaging with on-line mnotioring of the Raman scattering G band of conducting SW CNTs.

3. SThM Raman

Scanning thermal conductivity image (SThM of GaN nanowire with on-line Raman in vacuum environemnt (ACS Nano Vol. 5 No.1, 2011)

4. AFM Raman

AFM-Raman imaging of semiconductor device.

5. BioAFM Raman

AFM-Raman collage of lignin distribution on wood cell walls.

6. SECM Raman

SECM with on-line Raman monitoring of Cu etching.

7. Nanolithography Raman

Fountain pen nanolithography demonstrating controlled deposition of single wall CNTs with Raman determination of the CNT alignment (Nano Lett. 2016, 16, 1517-1522).



TERS – Achieving the Raman Potential

TERS diagram
Cover paper in The Analyst (vol. 138(11), 2013, 3150-3157) showing TERS measurements on protein ligand bindings

Tip Enhanced Raman Spectroscopy (TERS) has yielded exciting results, overcoming a previously insurmountable obstacle in Raman spectroscopy. With TERS, the AFM-Raman integration can reach its full potential, enabling both stronger signal and nanometric sub-diffraction Raman resolution. Nanonics Imaging AFM-Raman systems are uniquely designed to achieve the most challenging TERS measurements with the highest resolution, with repeatable and user-friendly operation. This sub-diffraction resolution is increasingly important in analyzing today’s newest materials on the nanoscale.


User-Friendly & Reliable TERS Operation

Tip Enhanced Raman Spectroscopy Diagram



  • TERS Hot-Spot "Lock-In": quick and easy finding of the TERS hot-spot
  • Accurate TERS measurements on a variety of samples
  • Highest quality TERS probes 
  • All TERS configuration possible with one system: Reflection, Transmission, and Side-Illumination
  • Proven TERS operation on the widest spectrum of samples




3 point TERS measurement on a sample comprised of a thin layer of strained Si on bulk Si. Automated 3 point Raman measurements allow for mapping both the far-field and TERS effect at each point, as well as their difference. The difference map shows the pure TERS effect without any contribution of the far-field background








Real TERS on Real Samples

1. TERS of Strained Si

Ters of strained SiGe pattern on bulk Si. The thin SiGe lines are not visible in the far-field (right) but are clearly seen with TERS (left), demonstrating features diwn to 40 nm (Proc. of SPIE vol. 9424).

2. TERS of Si Nanowire

TERS of 50 nm Si Nanowire (arxiv preprint arxiv:1705.08622 (2017)).

3. TERS of Graphene

D-band monitoring of the doping distribution in mono-layer Graphene flake on SiO2/Si substrate by TERS (Carbon 111, 2017, 67-73).

4. TERS of GaN Nanowire

Study of impurities in single GaN nanowires by TERS (Applied Phys. Lett. 107, 123108 (2015)).

5. TERS of Single Layer Graphene

Difference TERS for indentifying single layer Graphene.

6. TERS of Cells

TERS for selective detection of RGD-Integrin binding in cancer cells. (Anal. Chem 2016, 88, 6547-6553).

7. TERS of 2D Materials

TERS of CuPc molecules on MoS2 substrate (Journal of Selected Topics in Quantam Electronics, vol. 23, no.2, 2017).


---Key Features---


The SpectraView is designed to generate exceptional results from both the AFM and the on-line Raman. Featuring VISTA (Vivid Imaging Soft Touch AFM), the system enables AFM imaging with the highest resolution. The SpectraView is the only AFM designed for natural Raman integration, not requiring any modification to the Raman optical path.

 raman/afm system

Nanonics AFM-Raman system enables integration of water immersion objective from above for high Raman collection efficiency in liquid with on-line AFM.


Unobstructed image from above of sample and probe in liquid environment, highlighting Nanonics natural top-down integrations. The Nanonics system employs glass cantilevered AFM and TERS probes, providing for complete optical integration.

Best Optical Integration

True optical compatibility:

  • Operate with high NA objectives
  • Integrate with water and oil immersion objectives


All optical configurations available in one configuration:

  • True upright integration
  • Side
  • Inverted

AFM Designed for Advanced Raman Integration

Tip Enhanced Raman Spectroscopy Diagram






  • Tuning fork feedback without any optical interference with Raman laser
  • Advanced SPM measurements with on-line Raman
  • Ultra large Z range
  • Manipulation and lithography with online Raman
  • TERS operation in a wide variety of applications
  • VISTA for AFM imaging of the most challenging samples in air and liquid


 Most Versatile System

  • Scanning options: tip and sample scanning in one scanning head
  • Optical integration options: Sit on microscope, separate, upright, inverted, side, or dual
  • Large sample stage (optional)
  • Compatible in a range of environmental conditions: Vacuum, Liquid, Low temperature, SECM




Customize for YOUR research specifications and needs.

Select probe quantity, integration option, and configuration:


A. Probe Quantity

1. Single Probe SpectraView

  • Developed for ease-of-use and flexibility for easy integration with any Raman
  • Compact and flat design


2. Multi-Probe SpectraView (up to 4 SPM probes)

  • Simultaneous probing of multiple measurements of your sample
  • Probe station for conductive AFM measurements with on-line Raman
  • On-line manipulation and characterization


B. Integration Options

1. Complete AFM-Raman-TERS Package

Nanonics offers a complete turn-key package - with complete AFM-Raman-TERS capability


2. Upgrade Package

Already have a spectrometer? 

Nanonics offers the broadest selection of hardware and software integration packages - compatible with all of the leading Raman providers.

C. Multiple Configurations

Click on the images below for more details.

Contact a Nanonics specialist for detailed configuration options.


Do you have a question about a product?
Are you interested in a quote?
Get a customized quote for your research needs
Looks like Nanonics would be a great fit for your SPM research. Would you like to receive a customized quote?