AFM and NSOM of A Multi Mode Fibre

 

 

 

A) AFM topographic image of a cleaved multimode optical fiber obtained with AFM/NSOM probe. 
B) A correlating NSOM image in collection mode obtained simultaneously with (A). 
C) A 3D collage AFM/NSOM of the output optical distribution with exact correspondence to the surface’s topography.

 

  • Near-field optical distribution of a multimode optical fiber launched with 532nm laser.

  • The Nanonics' 3D FlatScanTM stage allows for vertical mounting of the optical 

    fiber with a flexible geometry for optical microscopy integrations.

  • The sample is kept stationary along the scan to prevent any disturbance of the light propagation through the fiber. Nanonics systems with Tip-Scanning capabilities are ideal in such applications for true profiling of the optical output. 
     
  • The AFM/NSOM fully correlated imaging is based on tuning fork feedback in normal mode.

 

 

Nanonics Nano3D Distortion Free, Near-field/Far-field  Beam

Profiler

 

This novel product provides high precision, 50nm optical resolution with simultaneous topography and without deconvolution. 

 

  • Unprecedented error-free profiling of divergent sources with no detector saturation or beam attenuation. 

 

  • No non-uniformities or astigmatisms in profiling active or passive sources such as VCSELs, AWGs, Ultrasmall Mode Field Diameter Lensed Fibers etc.
  • Seamless complex beam structures 3D profiles from the near-field to the far-field with overlapping fields of view.

 

 

 

Ideal systems for this application:

 

 

 

 

  An optical fiber vertically mounted on MultiView 2000TM SPM head integrated with an upright optical microscope 
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