Transparent integration with any SEM or FIB with a sample chamber big enough.
Normal Force Sensing: Contact, Non-Contact, and Intermittent Contact Modes in SPM
High resolution Cathodoluminescence measurement
Electron microscopies are a driving force in the nanotechnological revolution that we find ourselves in today. Atomic force microscopy along with scanning tunneling microscopy is another enabling technology in the growing field of nanotechnology. These two worlds, although highly complimentary, have generally been separate and apart.
For the first time ever, Nanonics Imaging Ltd. in its drive for integrated microscopic solutions has now been able to fully and transparently integrate these two worlds.
