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Awards Won

The Nanonics Awards Gallery

The Photonics Circle of Excellence
2002

The Rank Prize for Opto-Electronics
1997

The Photonics Circle of Excellence
1996

The Laser Focus
1996

R and D
1993

Nanonics is proud to display here some of the awards it has won over the last few years. These awards are evidence of the continued excellence of Nanonics and its innovative technology. (Click on the award to see details)


Award

The Photonics Circle of Excellence Award 2002

This collaborative product brings together for the first time, in one commercial system, the chemical sensitivity of Raman spectroscopy and the ultra-high spatial resolution of scanning probe and near-field optical microscopy. 

The spatial resolution of Raman systems employing normal optical microscopes is limited to approximately the wavelength of the light (about 0.5 µm), because both the illuminating laser light and the Raman scattered light are collected in the optical far-field (i.e. many wavelengths of light away from the scattering material).

This resolution is sufficient for many users, but some need the higher resolutions attainable with scanning probe microscopies (SPM), such as atomic force microscopy (AFM) and near-field scanning optical microscopy (NSOM). This need is fulfilled with the new combined Nanonics NSOM/AFM-100 Confocal™/Renishaw RM Series Raman microscope.

The Renishaw/Nanonics combined instrument can operate in two modes:

AFM/NSOM with far-field Raman - Offers users high spatial resolution scanning probe data, combined with far-field resolution Raman data (typically 0.5 µm spatial resolution). Now Raman data can be recorded and correlated with high spatial resolution topographic, electrical, thermal and near-field optical data.

AFM/NSOM with near-field Raman - Offers users high spatial resolution data for both scanning probe and Raman.

The hardware and the software of the Nanonics NSOM/AFM-100 Confocal™ system are integrated with the Renishaw RM Series microscope. Previously, investigating a sample with both scanning probe microscopy and Raman microscopy required moving the sample from instrument to instrument. The exact region being analysed by the Raman microscope could not generally be found again for imaging with the chosen scanning probe microscopic technique. The Nanonics/Renishaw microscope system makes simultaneous Raman spectroscopy and scanning probe microscopy possible.

The Nanonics system uses a patented optical fibre probe design. The cantilevered optical fibre is held between the objective lens and the sample without obstructing any aspect of the far-field conventional microscope. The tip of the fibre is exposed, allowing direct viewing of the scanned region in the microscope eyepieces or on the video viewer. This is not possible in a standard AFM that uses a silicon micromachined tip, which obscures the scanned region in the standard upright microscope. It is also not possible with straight near-field optical fibre probes.

When mounted on a Renishaw Raman microscope, the novel design of the Nanonics system means that the user can record a wide variety of scanning probe imaging modes in parallel with Raman spectroscopy. For example, while the silicon Raman peak of a microcircuit is being monitored to detect stress in the silicon, the Raman spectroscopist can simultaneously measure the micro topography with AFM, and the micro reflectivity with NSOM.


The Rank Prize for Opto-Electronics Awarded to the President of Nanonics, Professor Aaron Lewis, 1997

The Rank Prize for Opto-Electronics Awarded to Professor Aaron Lewis for his outstanding contribution to the science and application of Opto-electronics

Quote taken from the award given: 

"This microscope has already demonstrated its value as a reliable, relatively inexpensive tool for the optical characterisation of surfaces. It has been applied to histological specimens and biological samples which are much smaller than the diffraction limit. As a sub-wavelength emitter it extends optical lithography, making possible high density data storage and integrated circuits of the finest dimensions. The future of near-field optical microscopy seems certain to include even more far-reaching technological applications and to revolutionise our understanding of biological processes."
Chairman of the Trustees 
THE RANK PRIZE FUNDS 
London - 17th March 1997 


Award

Award

The Photonics Circle of Excellence Award 1996

Nanonics Imaging Ltd. has been cited by Photonics Spectra Magazine for developing one of the twenty-five best new products of the year.

This award is bestowed on Nanonics for the NSOM/SPM-100 Confocal™ (now called the MultiView 1000™) in recognition of excellence, innovation and achievement in the field of photonics technology.



Award

The Laser Focus World Commercial Technology Achievement Award 1996

Presented to Nanonics Ltd. Jerusalem, Israel for 3-D scanner for the optical/scanned probe microscopist.

The Laser Focus World Commercial Technology Achievement Awards recognize significant and lasting achievements in commercial electro-optical technology.
  


R and D Award 1993

Presented to Nanoptics, For the development of Glass capillary X-ray concentrator
Selected by R&D magazine as one of the 100 Most Technologically Significant new Products of the year



 



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