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Materials and Surface Nanoscience
Online AFM/Raman of an Si/SiO2 Grid
AFM/Raman of Cardiac Stent
Topographic Images of the Fisher's Sample
Collage of Raman Intensity & AFM Topography of a Diamond Film
Raman Imaging with AFM Auto-Focus
AFM Phase Images of TMP Sample
Raman/AFM Depth Profiling of a Polymer Blend/PDMS/Chloroform
NanoIndentation and Raman Characterization
Diamond Film Raman with AFM On-Line Auto-Focus
AFM/Raman Collage of Name Card
AFM/Thermal in Non-Contact Mode
Topographic Imaging of Silver Nanoparticles
AFM Raman of CNT Nanowire on Silicon
MultiProbe NanoIndentation & AFM Profiling with On-line Raman
AFM/Raman of Strained Si Transistor
Large Z-Range Imaging of Razor Blade
Off-Axis Enhancement
Quantum Dots Imaging
Quantum Dots Imaging
AFM/Raman of Si/SiO2 Grid
Grain Boundary Imaging in HOPG
Nanoindentation
Wood Sample
Carbon Nanotubes
HOPG
FIB Etched Trench
Optoelectronic Device Structure
AFM Imaging of Textile Fibers
0.5x0.5µ Carbon Nanotubes
PEO Spherulite
TFT in Liquid Crystal Display
Raman-AFM of MEMs device
Magneto Optic Disc
SEM/AFM Integration
AFM, NSOM and Capicatance
30nm Gold Balls
Internal Imaging of a Deep Trench
Alumina Template
Image of Standard Silicon AFM Tip
Deep Trench / Side-Wall Imaging
Zoom on Carbon Nanotube
Simultaneous AFM/NSOM and Capacitance
Carbon Nanotubes
Topographic Imaging of Silver Nanoparticles
Quantum Dots Imaging




AFM with On-Line Raman of Strained Silicon

 
TERS & ANSOM WITH NANONICS SYSTEMS

NANONICS SYSTEMS ARE DESIGNED FOR ALL MODES OF NSOM & SPM WITH ONLINE SIMULTANEOUS RAMAN.  

 Nanonics systems integrate a variety of innovations that permit ultimate in TERS & Apertureless NSOM :

 

INDEPENDENT TIP & SAMPLE - MOVEMENT & CONTROL
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Difference Raman 
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Image Oversampling
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Off Axis Z Polarization Tip Placement

NO TIP RAMAN BACKGROUND  
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Transparent Glass Dielectric
  
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Single Gold Nanoparticle  
  
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Exposed tip Geometry

NO TOPOGRAPHIC ARTIFACTS   
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On-Line AFM AutoFocus

INTEGRATION WITH ALL MICROSCOPES  
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Upright Microscope
  
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Inverted Microscope
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Dual 4Pi Microscope

 

 

mv4000_ters_370_01

 

 A single Tower of Multiprobe MultiView4oooTM
system with independent Tip & Sample-Scanning
having nanometric resolution and free optical axis
from Above, below and side view
.

 

Difference Raman    

Measurements can be recorded with the tip in contact and out of contact which is controlled by the tip scanner. The out of contact position can be controlled with nanometric resolution.

A Difference Raman spectrum shows an enhancement of a strained silicon band
of 70nm sSi layer on Si bulk obtained with Nanonics' TERS Gold Nanoparticle Probe.

 
    

IMAGE OVERSAMPLING

Nanometric AFM controlled independent xy sample movement where multiple positions are sampled relative to the laser spot size leading to additional enhanced resolution

NO TIP RAMAN BACKGROUND

Patented gold nanoparticle tipped glass probes with exposed tip geometry for maximum enhancement by the gold metal embedded in a dielectric

 

EXPOSED TIP GEOMETRY                    NO TOPOGRAPHIC ARTIFACTS

Gold nanoparticle well exposed to the optical axis and easily irradiated from the top, bottom and sides  

Shown below is the exposed tip geometry of a gold nanoparticle cantilevered glass probe                       


The sample scanner moves the sample with AFM Z feedback keeping the sample at exactly the same position relative to the lens at every pixel in the image

AFM feedback maintains the sample at the focal point of the objective at every pixel of the image (shown below)

gold_nanoparticle_probe_for_spm_585  auto_focus_611 
    

Nanonics Gold Nano-particle Probe: A unique probe with a single gold nanoparticle at the tip of a cantilevered glass structure.  The probe is for use in Nanonics MultiView AFM & NSOM Systems which can be transparently combined with standard microRaman Systems based on upright or inverted microscopes.  The probe with its exposed tip geometry allows for ease of illumination of the gold nanoparticle from above, below or from any side.  It is therefore compatible with all Nanonics SPM platforms including their innovative Multiprobe Scanned Probe Microscopy Systems recently introduced.  Such SPM probes have been shown to have excellent characteristics for tip enhanced Raman spectroscopy (TERS) and other apertureless near-field optical measurements based on plasmonic interactions.

TERS spectra shown above were obtained with the single gold nanoparticle probe (right SEM image). These spectra were obtained with off axis nanoparticle tip positioning in the z sidelobe of a Gaussian focused laser beam from above. No radial polarization was used.                                                                                    sem_gold_nanoparticle_503

strained_silicon_enhancement_516   
 cnt_enhancement_582_01  

 

 

 

 



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