| TERS & ANSOM WITH NANONICS SYSTEMS |
|
NANONICS SYSTEMS ARE DESIGNED FOR ALL MODES OF NSOM & SPM WITH ONLINE SIMULTANEOUS RAMAN.
|
Nanonics systems integrate a variety of innovations that permit ultimate in TERS & Apertureless NSOM :
|
INDEPENDENT TIP & SAMPLE - MOVEMENT & CONTROL
Ø Difference Raman
Ø Image Oversampling
Ø Off Axis Z Polarization Tip Placement
NO TIP RAMAN BACKGROUND
Ø Transparent Glass Dielectric
Ø Single Gold Nanoparticle
Ø Exposed tip Geometry
NO TOPOGRAPHIC ARTIFACTS
Ø On-Line AFM AutoFocus
INTEGRATION WITH ALL MICROSCOPES
Ø Upright Microscope
Ø Inverted Microscope
Ø Dual 4Pi Microscope
|
|
| |
A single Tower of Multiprobe MultiView4oooTM
system with independent Tip & Sample-Scanning
having nanometric resolution and free optical axis
from Above, below and side view.
|
|
Difference Raman
Measurements can be recorded with the tip in contact and out of contact which is controlled by the tip scanner. The out of contact position can be controlled with nanometric resolution.
A Difference Raman spectrum shows an enhancement of a strained silicon band
of 70nm sSi layer on Si bulk obtained with Nanonics' TERS Gold Nanoparticle Probe.
|
|
|
|
IMAGE OVERSAMPLING
Nanometric AFM controlled independent xy sample movement where multiple positions are sampled relative to the laser spot size leading to additional enhanced resolution
NO TIP RAMAN BACKGROUND
Patented gold nanoparticle tipped glass probes with exposed tip geometry for maximum enhancement by the gold metal embedded in a dielectric
EXPOSED TIP GEOMETRY NO TOPOGRAPHIC ARTIFACTS
|
Gold nanoparticle well exposed to the optical axis and easily irradiated from the top, bottom and sides
Shown below is the exposed tip geometry of a gold nanoparticle cantilevered glass probe
|
The sample scanner moves the sample with AFM Z feedback keeping the sample at exactly the same position relative to the lens at every pixel in the image
AFM feedback maintains the sample at the focal point of the objective at every pixel of the image (shown below)
|
|
|
Nanonics Gold Nano-particle Probe: A unique probe with a single gold nanoparticle at the tip of a cantilevered glass structure. The probe is for use in Nanonics MultiView AFM & NSOM Systems which can be transparently combined with standard microRaman Systems based on upright or inverted microscopes. The probe with its exposed tip geometry allows for ease of illumination of the gold nanoparticle from above, below or from any side. It is therefore compatible with all Nanonics SPM platforms including their innovative Multiprobe Scanned Probe Microscopy Systems recently introduced. Such SPM probes have been shown to have excellent characteristics for tip enhanced Raman spectroscopy (TERS) and other apertureless near-field optical measurements based on plasmonic interactions.
| TERS spectra shown above were obtained with the single gold nanoparticle probe (right SEM image). These spectra were obtained with off axis nanoparticle tip positioning in the z sidelobe of a Gaussian focused laser beam from above. No radial polarization was used. |
 |
|