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Integrated Microscopy
AFM/Raman of Si/SiO2 Grid
SEM/AFM Integration
Antenna Probes
Nanonics Systems Can Use Any Probe
Antenna Probes
Large Z-Range Imaging of Razor Blade
AFM/Raman of Strained Si Transistor
AFM Raman of CNT Nanowire on Silicon
Online AFM/Raman of an Si/SiO2 Grid
Unique Probes
Antenna Probes
FIB Etched Trench
Thermal Imaging of Optical Fiber
AFM, NSOM and Capicatance
Nano biological AFM NSOM solutions
Image of Standard Silicon AFM Tip
Second Harmonic Imaging and Non-Linear Microscopy
Depth Profiling of a Polymer Blend
Micro-electronic Device Structures
Photonic Band Gap Materials
AFM Raman Imaging




AFM/Thermal in Non-Contact Mode
SRAM AFM, Thermal and Resistance Imaging

25x25 micron Thermal Image

AFM Image of the same region obtained in the Intermittent contact mode 

 

 

 

Only Nanonics Thermal Probes are capable of thermal imaging in the intermittent contact mode.

These images were obtained by the
MultiView 400™

 

Simultaneous Resistivity Image of the same region

Nanonics Thermal Probes have a thermal response time under 20us, thermal resolution under 10 millidegrees and nanometric spacial resolution.

In the Dual Wire Thermoresistive probe, two platinum wires are stretched through the nanopipette and fused together at their tips. This fused junction has a resistance that is temperature-dependent. This unique tip allows simultaneous measurement of surface topography with thermal conductivity or temperature.

 
SEM of Dual-Wire thermoresistive probe showing fused junction


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